{"title":"Display Metrology Plays Vital Role in Display Ecosystem","authors":"Tom Fiske","doi":"10.1002/msid.1521","DOIUrl":null,"url":null,"abstract":"<div>\n \n <p>Display metrology course educates and informs as Display Week showcases advances in standards, instrumentation, and applications in display measurement.</p>\n </div>","PeriodicalId":52450,"journal":{"name":"Information Display","volume":"40 5","pages":"42-46"},"PeriodicalIF":0.0000,"publicationDate":"2024-09-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1002/msid.1521","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Information Display","FirstCategoryId":"1085","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1002/msid.1521","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"Engineering","Score":null,"Total":0}
引用次数: 0
Abstract
Display metrology course educates and informs as Display Week showcases advances in standards, instrumentation, and applications in display measurement.
期刊介绍：
Information Display Magazine invites other opinions on editorials or other subjects from members of the international display community. We welcome your comments and suggestions.
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