Assessment of the Contribution of Minority Carriers to the Thermo-electromotive Force of Thermoelectric Generators in the Case Where the Electrical Conductivity of the Majority Carriers Remains Very Large Compared to that of the Minority Carriers

IF 2.2 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Electronic Materials Pub Date : 2024-09-16 DOI:10.1007/s11664-024-11366-5
André Siewe Kamegni, Igor Lashkevych
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Abstract

A theoretical prediction of the contribution to the thermo-electromotive force (thermo-EMF) of a thermocouple due to the minority charge carriers in both legs is presented. This prediction is made on the assumption that, at any time, the electrical conductivity of the majority charge carriers \(\sigma _M\) remains very large compared to the electrical conductivity of the minority carriers \(\sigma _m\) (\(\sigma _M\gg \sigma _m\)). The expression has also been analyzed in order to find strategies to reduce its negative impact on the thermo-EMF of the thermocouple. Finally, calculations were carried out in the case of the thermocouple made of silicon thermoelements. The results show that the presence of minority carriers in the thermocouple legs can either positively or negatively affect the generated thermo-EMF. Whenever the contribution is negative, its magnitude may be reduced by widening the bandgap of the N-type leg and/or narrowing that of the p-type leg, adjusting the length of the legs, or intensifying recombinations on the surfaces of the P-type leg

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在多数载流子的电导率与少数载流子的电导率相比仍然非常大的情况下评估少数载流子对热电发生器热电动势的贡献
本文从理论上预测了热电偶的热电动势(thermo-EMF)是由两条腿上的少数电荷载流子造成的。这一预测是基于以下假设做出的:在任何时候,多数电荷载流子的电导率\(\sigma _M\)与少数载流子的电导率\(\sigma _M\gg\sigma _m\)相比都非常大。还对该表达式进行了分析,以便找到减少其对热电偶热电磁场负面影响的策略。最后,对硅热电偶进行了计算。结果表明,热电偶支脚中少数载流子的存在会对产生的热电磁场产生积极或消极的影响。如果是负面影响,则可以通过拓宽 N 型引脚的带隙和/或缩小 P 型引脚的带隙、调整引脚长度或加强 P 型引脚表面的重组来降低影响程度。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Journal of Electronic Materials
Journal of Electronic Materials 工程技术-材料科学:综合
CiteScore
4.10
自引率
4.80%
发文量
693
审稿时长
3.8 months
期刊介绍: The Journal of Electronic Materials (JEM) reports monthly on the science and technology of electronic materials, while examining new applications for semiconductors, magnetic alloys, dielectrics, nanoscale materials, and photonic materials. The journal welcomes articles on methods for preparing and evaluating the chemical, physical, electronic, and optical properties of these materials. Specific areas of interest are materials for state-of-the-art transistors, nanotechnology, electronic packaging, detectors, emitters, metallization, superconductivity, and energy applications. Review papers on current topics enable individuals in the field of electronics to keep abreast of activities in areas peripheral to their own. JEM also selects papers from conferences such as the Electronic Materials Conference, the U.S. Workshop on the Physics and Chemistry of II-VI Materials, and the International Conference on Thermoelectrics. It benefits both specialists and non-specialists in the electronic materials field. A journal of The Minerals, Metals & Materials Society.
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