Role of buffer layers on the strain-induced insulator-metal transition of VO2 thin films: a review

IF 8.1 2区 材料科学 Q1 MATERIALS SCIENCE, MULTIDISCIPLINARY Critical Reviews in Solid State and Materials Sciences Pub Date : 2024-09-04 DOI:10.1080/10408436.2024.2400346
E. K. Suresh, B. Arun, J. Andrews, T. S. Akhil Raman, P. Nikhil Mohan, C. Shivakumar, K. C. James Raju
{"title":"Role of buffer layers on the strain-induced insulator-metal transition of VO2 thin films: a review","authors":"E. K. Suresh, B. Arun, J. Andrews, T. S. Akhil Raman, P. Nikhil Mohan, C. Shivakumar, K. C. James Raju","doi":"10.1080/10408436.2024.2400346","DOIUrl":null,"url":null,"abstract":"Vanadium oxide (VO<sub>2</sub>) is a strongly correlated material that undergoes an insulator to metal transition at around 68 °C. Unlike other vanadium oxides, VO<sub>2</sub> shows phase transition behavior near room temperature, making it an appropriate candidate material for different applications such as thermochromic devices, microwave tunable devices, memory devices, etc. Many practical applications necessitate further tuning of the phase transition temperature to make it more adaptable, either below or above 68 °C. This adaptability is crucial for device efficiency and versatility. The phase transition behavior can be changed by various techniques, including light irradiation, lattice strain modulation, external electric field, and higher and lower valence elements doping. Strain variation is a widely used strategy in the aforementioned methods, and it is achieved by either using suitable substrates or incorporating appropriate buffer layers. This article reviews the various buffer layers used in VO<sub>2</sub> thin films and their role in the insulator-metal transition behavior and thermochromic properties, highlighting their significance in enhancing the material’s performance in various applications.","PeriodicalId":55203,"journal":{"name":"Critical Reviews in Solid State and Materials Sciences","volume":"18 1","pages":""},"PeriodicalIF":8.1000,"publicationDate":"2024-09-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Critical Reviews in Solid State and Materials Sciences","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1080/10408436.2024.2400346","RegionNum":2,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0

Abstract

Vanadium oxide (VO2) is a strongly correlated material that undergoes an insulator to metal transition at around 68 °C. Unlike other vanadium oxides, VO2 shows phase transition behavior near room temperature, making it an appropriate candidate material for different applications such as thermochromic devices, microwave tunable devices, memory devices, etc. Many practical applications necessitate further tuning of the phase transition temperature to make it more adaptable, either below or above 68 °C. This adaptability is crucial for device efficiency and versatility. The phase transition behavior can be changed by various techniques, including light irradiation, lattice strain modulation, external electric field, and higher and lower valence elements doping. Strain variation is a widely used strategy in the aforementioned methods, and it is achieved by either using suitable substrates or incorporating appropriate buffer layers. This article reviews the various buffer layers used in VO2 thin films and their role in the insulator-metal transition behavior and thermochromic properties, highlighting their significance in enhancing the material’s performance in various applications.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
缓冲层对 VO2 薄膜应变诱导的绝缘体-金属转变的作用:综述
氧化钒(VO2)是一种强相关材料,在 68 ℃ 左右会发生从绝缘体到金属的转变。与其他钒氧化物不同,VO2 在室温附近显示出相变行为,使其成为热致变色器件、微波可调器件、存储器件等不同应用的合适候选材料。许多实际应用都需要进一步调整相变温度,使其适应性更强,可以低于或高于 68 ℃。这种适应性对器件的效率和多功能性至关重要。相变行为可通过各种技术改变,包括光照射、晶格应变调制、外加电场以及掺杂高价和低价元素。应变变化是上述方法中广泛使用的一种策略,可通过使用合适的基底或加入适当的缓冲层来实现。本文回顾了 VO2 薄膜中使用的各种缓冲层及其在绝缘体-金属转变行为和热致变色特性中的作用,强调了它们在提高材料在各种应用中的性能方面的重要意义。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
CiteScore
22.10
自引率
2.80%
发文量
0
审稿时长
3 months
期刊介绍: Critical Reviews in Solid State and Materials Sciences covers a wide range of topics including solid state materials properties, processing, and applications. The journal provides insights into the latest developments and understandings in these areas, with an emphasis on new and emerging theoretical and experimental topics. It encompasses disciplines such as condensed matter physics, physical chemistry, materials science, and electrical, chemical, and mechanical engineering. Additionally, cross-disciplinary engineering and science specialties are included in the scope of the journal.
期刊最新文献
Role of buffer layers on the strain-induced insulator-metal transition of VO2 thin films: a review Dynamic recrystallization during solid state friction stir welding/processing/additive manufacturing: Mechanisms, microstructure evolution, characterization, modeling techniques and challenges Recent advances in graphene allotropes-based fire detection sensors Recent advances in magnesium alloys and its composites for bioimplant applications: Processing, matrix, reinforcement, and corrosion perspectives Carbon nano-onions reinforced nanocomposites: Fabrication, computational modeling techniques and mechanical properties
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1