A New Concept of Determining the RFID Chip Impedance

IF 4.5 1区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Transactions on Microwave Theory and Techniques Pub Date : 2024-09-17 DOI:10.1109/TMTT.2024.3454287
Kacper Skrobacz;Patryk Pyt;Piotr Jankowski-Mihułowicz;Mariusz Węglarski
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Abstract

The knowledge on methods for measuring input impedance in microelectronic circuits across various operating frequencies is a critical aspect of designing efficient RFID transponder antennas. The precise determination of this parameter is particularly important for optimizing the overall performance of automatic radio-identification systems in compliance with national standards. The conventional methods in this scope involve direct measurements of RFID chip parameters by using expensive and sophisticated apparatus (e.g., vector network analyzer). Other indirect methods rely on the approximate estimation of this parameter for the fully assembled transponder operating within a test RFID system in a controlled laboratory environment (e.g., anechoic chamber). Therefore, an interesting alternative is to indirectly determine the chip input impedance, by adjusting parameters of the connected antenna and monitoring variations in the minimum power that is supplied to the transponder and at which the chip can be activated (power on tag forward (POTF) characteristic). Thus, the objective of this research is to establish fundamental theoretical relationships that can be used to anticipate fluctuations in the interrogation zone characteristics. These relationships should enable the prediction of how the characteristics change for various levels of impedance mismatch between the antenna and the RFID chip, as values of signal power and operating frequency vary.
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确定 RFID 芯片阻抗的新概念
在不同工作频率的微电子电路中测量输入阻抗的方法是设计高效RFID应答器天线的关键方面。该参数的精确确定对于优化符合国家标准的自动无线电识别系统的整体性能尤为重要。在这个范围内的传统方法涉及使用昂贵和复杂的仪器(例如,矢量网络分析仪)直接测量RFID芯片参数。其他间接方法依赖于在受控实验室环境(例如,消声室)中测试RFID系统中完全组装的应答器运行的该参数的近似估计。因此,一个有趣的替代方案是通过调整连接天线的参数和监测提供给应答器的最小功率的变化来间接确定芯片的输入阻抗,并且芯片可以被激活(标签向前供电(POTF)特性)。因此,本研究的目的是建立可用于预测审讯区特征波动的基本理论关系。随着信号功率和工作频率的变化,这些关系应该能够预测天线和RFID芯片之间的各种阻抗不匹配水平的特性变化。
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来源期刊
IEEE Transactions on Microwave Theory and Techniques
IEEE Transactions on Microwave Theory and Techniques 工程技术-工程:电子与电气
CiteScore
8.60
自引率
18.60%
发文量
486
审稿时长
6 months
期刊介绍: The IEEE Transactions on Microwave Theory and Techniques focuses on that part of engineering and theory associated with microwave/millimeter-wave components, devices, circuits, and systems involving the generation, modulation, demodulation, control, transmission, and detection of microwave signals. This includes scientific, technical, and industrial, activities. Microwave theory and techniques relates to electromagnetic waves usually in the frequency region between a few MHz and a THz; other spectral regions and wave types are included within the scope of the Society whenever basic microwave theory and techniques can yield useful results. Generally, this occurs in the theory of wave propagation in structures with dimensions comparable to a wavelength, and in the related techniques for analysis and design.
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