Peter Ercius, Ian J Johnson, Philipp Pelz, Benjamin H Savitzky, Lauren Hughes, Hamish G Brown, Steven E Zeltmann, Shang-Lin Hsu, Cassio C S Pedroso, Bruce E Cohen, Ramamoorthy Ramesh, David Paul, John M Joseph, Thorsten Stezelberger, Cory Czarnik, Matthew Lent, Erin Fong, Jim Ciston, Mary C Scott, Colin Ophus, Andrew M Minor, Peter Denes
{"title":"The 4D Camera: An 87 kHz Direct Electron Detector for Scanning/Transmission Electron Microscopy.","authors":"Peter Ercius, Ian J Johnson, Philipp Pelz, Benjamin H Savitzky, Lauren Hughes, Hamish G Brown, Steven E Zeltmann, Shang-Lin Hsu, Cassio C S Pedroso, Bruce E Cohen, Ramamoorthy Ramesh, David Paul, John M Joseph, Thorsten Stezelberger, Cory Czarnik, Matthew Lent, Erin Fong, Jim Ciston, Mary C Scott, Colin Ophus, Andrew M Minor, Peter Denes","doi":"10.1093/mam/ozae086","DOIUrl":null,"url":null,"abstract":"<p><p>We describe the development, operation, and application of the 4D Camera-a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 87,000 Hz. The detector generates data at ∼480 Gbit/s which is captured by dedicated receiver computers with a parallelized software infrastructure that has been implemented to process the resulting 10-700 Gigabyte-sized raw datasets. The back illuminated detector provides the ability to detect single electron events at accelerating voltages from 30 to 300 kV. Through electron counting, the resulting sparse data sets are reduced in size by 10--300× compared to the raw data, and open-source sparsity-based processing algorithms offer rapid data analysis. The high frame rate allows for large and complex scanning diffraction experiments to be accomplished with typical scanning transmission electron microscopy scanning parameters.</p>","PeriodicalId":18625,"journal":{"name":"Microscopy and Microanalysis","volume":" ","pages":"903-912"},"PeriodicalIF":2.9000,"publicationDate":"2024-11-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Microscopy and Microanalysis","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1093/mam/ozae086","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
Abstract
We describe the development, operation, and application of the 4D Camera-a 576 by 576 pixel active pixel sensor for scanning/transmission electron microscopy which operates at 87,000 Hz. The detector generates data at ∼480 Gbit/s which is captured by dedicated receiver computers with a parallelized software infrastructure that has been implemented to process the resulting 10-700 Gigabyte-sized raw datasets. The back illuminated detector provides the ability to detect single electron events at accelerating voltages from 30 to 300 kV. Through electron counting, the resulting sparse data sets are reduced in size by 10--300× compared to the raw data, and open-source sparsity-based processing algorithms offer rapid data analysis. The high frame rate allows for large and complex scanning diffraction experiments to be accomplished with typical scanning transmission electron microscopy scanning parameters.
期刊介绍:
Microscopy and Microanalysis publishes original research papers in the fields of microscopy, imaging, and compositional analysis. This distinguished international forum is intended for microscopists in both biology and materials science. The journal provides significant articles that describe new and existing techniques and instrumentation, as well as the applications of these to the imaging and analysis of microstructure. Microscopy and Microanalysis also includes review articles, letters to the editor, and book reviews.