{"title":"Wide spectral range optical characterization of niobium pentoxide (Nb2O5) films by universal dispersion model","authors":"","doi":"10.1016/j.optmat.2024.116133","DOIUrl":null,"url":null,"abstract":"<div><div>In this work, the optical properties of niobium pentoxide (<span><math><mrow><msub><mrow><mtext>Nb</mtext></mrow><mrow><mn>2</mn></mrow></msub><msub><mrow><mtext>O</mtext></mrow><mrow><mn>5</mn></mrow></msub></mrow></math></span>) films were extensively studied across a wide spectral range using heterogeneous data-processing methods, combining ellipsometric and spectrophotometric measurements for five samples with thicknesses between 20 and 250 nm. This study primarily determined the optical constants of <span><math><mrow><msub><mrow><mtext>Nb</mtext></mrow><mrow><mn>2</mn></mrow></msub><msub><mrow><mtext>O</mtext></mrow><mrow><mn>5</mn></mrow></msub></mrow></math></span> from the far infrared to the vacuum ultraviolet, presenting these constants as dispersion parameters using the universal dispersion model to describe valence electron excitations in ultraviolet region as well as phonon vibrations in infrared region. These comprehensive and reliable data across such a broad spectral range are unprecedented. Secondly, presented optical characterization proofs that <span><math><mrow><msub><mrow><mtext>Nb</mtext></mrow><mrow><mn>2</mn></mrow></msub><msub><mrow><mtext>O</mtext></mrow><mrow><mn>5</mn></mrow></msub></mrow></math></span> films can be grown without defects such as surface roughness, porosity, or inhomogeneity. This fact, together with its high refractive index, makes <span><math><mrow><msub><mrow><mtext>Nb</mtext></mrow><mrow><mn>2</mn></mrow></msub><msub><mrow><mtext>O</mtext></mrow><mrow><mn>5</mn></mrow></msub></mrow></math></span> a promising material for optical applications.</div></div>","PeriodicalId":19564,"journal":{"name":"Optical Materials","volume":null,"pages":null},"PeriodicalIF":3.8000,"publicationDate":"2024-09-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Materials","FirstCategoryId":"88","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0925346724013168","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
引用次数: 0
Abstract
In this work, the optical properties of niobium pentoxide () films were extensively studied across a wide spectral range using heterogeneous data-processing methods, combining ellipsometric and spectrophotometric measurements for five samples with thicknesses between 20 and 250 nm. This study primarily determined the optical constants of from the far infrared to the vacuum ultraviolet, presenting these constants as dispersion parameters using the universal dispersion model to describe valence electron excitations in ultraviolet region as well as phonon vibrations in infrared region. These comprehensive and reliable data across such a broad spectral range are unprecedented. Secondly, presented optical characterization proofs that films can be grown without defects such as surface roughness, porosity, or inhomogeneity. This fact, together with its high refractive index, makes a promising material for optical applications.
期刊介绍:
Optical Materials has an open access mirror journal Optical Materials: X, sharing the same aims and scope, editorial team, submission system and rigorous peer review.
The purpose of Optical Materials is to provide a means of communication and technology transfer between researchers who are interested in materials for potential device applications. The journal publishes original papers and review articles on the design, synthesis, characterisation and applications of optical materials.
OPTICAL MATERIALS focuses on:
• Optical Properties of Material Systems;
• The Materials Aspects of Optical Phenomena;
• The Materials Aspects of Devices and Applications.
Authors can submit separate research elements describing their data to Data in Brief and methods to Methods X.