On-Chip Sensor for Monitoring Crack Propagation in Solder Joints Using RF Signals: Electrical Modeling and Circuit Design

IF 2.2 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Sensors Letters Pub Date : 2024-09-11 DOI:10.1109/LSENS.2024.3459031
Tae Yeob Kang;Yunah Her;Byeongcheol Choe;Gwang-hyeon Jeong
{"title":"On-Chip Sensor for Monitoring Crack Propagation in Solder Joints Using RF Signals: Electrical Modeling and Circuit Design","authors":"Tae Yeob Kang;Yunah Her;Byeongcheol Choe;Gwang-hyeon Jeong","doi":"10.1109/LSENS.2024.3459031","DOIUrl":null,"url":null,"abstract":"This letter presents an on-chip scale crack sensor for solder joints using radio frequency signals, essential for enhancing the reliability of electronic packages. The sensor design includes a Class F power amplifier and an envelope detector, based on an equivalent circuit model of cracked solder joints. Circuit simulations reveal that as a crack initiate, a resonant dip in the S-parameter pattern appears, with the resonant frequency decreasing as the crack propagates. Leveraging the resonant dip as a prognostic factor, the sensor can accurately characterize cracks in solder joints with easy-to-handle dc output. The sensor, which provides a maximum crack length sensitivity of 0.05 GHz/\n<inline-formula><tex-math>$\\upmu$</tex-math></inline-formula>\nm, is highly sensitive and can be fabricated on-chip.","PeriodicalId":13014,"journal":{"name":"IEEE Sensors Letters","volume":"8 10","pages":"1-4"},"PeriodicalIF":2.2000,"publicationDate":"2024-09-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Sensors Letters","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/10678841/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
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Abstract

This letter presents an on-chip scale crack sensor for solder joints using radio frequency signals, essential for enhancing the reliability of electronic packages. The sensor design includes a Class F power amplifier and an envelope detector, based on an equivalent circuit model of cracked solder joints. Circuit simulations reveal that as a crack initiate, a resonant dip in the S-parameter pattern appears, with the resonant frequency decreasing as the crack propagates. Leveraging the resonant dip as a prognostic factor, the sensor can accurately characterize cracks in solder joints with easy-to-handle dc output. The sensor, which provides a maximum crack length sensitivity of 0.05 GHz/ $\upmu$ m, is highly sensitive and can be fabricated on-chip.
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利用射频信号监测焊点裂纹扩展的片上传感器:电气建模和电路设计
这封信介绍了一种使用射频信号的片上焊点裂纹传感器,它对提高电子封装的可靠性至关重要。该传感器的设计包括一个 F 类功率放大器和一个包络探测器,均基于裂纹焊点的等效电路模型。电路仿真显示,随着裂纹的产生,S 参数模式中会出现共振凹陷,共振频率会随着裂纹的扩展而降低。利用共振凹陷作为预报因素,传感器可以准确地描述焊点裂纹的特征,并提供易于处理的直流输出。该传感器的最大裂纹长度灵敏度为 0.05 GHz/$\upmu$m,灵敏度高,可在芯片上制造。
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来源期刊
IEEE Sensors Letters
IEEE Sensors Letters Engineering-Electrical and Electronic Engineering
CiteScore
3.50
自引率
7.10%
发文量
194
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