Min-Kyu Park;Joon Hwang;Jong-Ho Bae;Jae-Joon Kim;Jong-Ho Lee
{"title":"Highly Reliable Lateral Migration-Based TFT-Type Neuron Device for Spiking Neural Networks","authors":"Min-Kyu Park;Joon Hwang;Jong-Ho Bae;Jae-Joon Kim;Jong-Ho Lee","doi":"10.1109/LED.2024.3445970","DOIUrl":null,"url":null,"abstract":"A CMOS-compatible Thin Film Transistor (TFT)-type Center Path neuron device with homeostasis characteristics is proposed. By modifying the charge injection path of the gate insulator stack, the proposed neuron device operates with lateral migration, which was conventionally perceived as a disadvantage in the memory industry. Various measured electrical characteristics of the Center Path device show that directly injected charges from the channel poly-Si to the charge trap Si\n<sub>3</sub>\nN\n<sub>4</sub>\n with low operational voltage laterally migrate to the Si\n<sub>3</sub>\nN\n<sub>4</sub>\n layer above the tunneling SiO\n<sub>2</sub>\n layer. Furthermore, the proposed Center Path device successfully demonstrates the integration with homeostasis functionality observed in biological neurons due to its discrete operational schemes.","PeriodicalId":13198,"journal":{"name":"IEEE Electron Device Letters","volume":"45 10","pages":"1780-1783"},"PeriodicalIF":4.1000,"publicationDate":"2024-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Electron Device Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10639458/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
A CMOS-compatible Thin Film Transistor (TFT)-type Center Path neuron device with homeostasis characteristics is proposed. By modifying the charge injection path of the gate insulator stack, the proposed neuron device operates with lateral migration, which was conventionally perceived as a disadvantage in the memory industry. Various measured electrical characteristics of the Center Path device show that directly injected charges from the channel poly-Si to the charge trap Si
3
N
4
with low operational voltage laterally migrate to the Si
3
N
4
layer above the tunneling SiO
2
layer. Furthermore, the proposed Center Path device successfully demonstrates the integration with homeostasis functionality observed in biological neurons due to its discrete operational schemes.
期刊介绍:
IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.