{"title":"All-in-One of Image Encryption, Identity Verification, and Photoelectric Watermark Based on Bidirectionally Photoresponsive Transistors","authors":"Tonglong Zeng;Dingwei Li;Rui Wang;Xiaotao Jing;Wanlin Zhang;Dinghan Zhang;Chen Yan;Peilin Zhang;Xiaohua Ma;Bowen Zhu;Hong Wang;Yue Hao","doi":"10.1109/LED.2024.3446872","DOIUrl":null,"url":null,"abstract":"Herein, In\n<sub>2</sub>\nO\n<sub>3</sub>\n/Al\n<sub>2</sub>\nO\n<sub>3</sub>\n/Y\n<sub>6</sub>\n transistors exhibiting bidirectional photoresponse (BPR) characteristic were fabricated. By utilizing this feature, XOR optoelectronic logic gate was successfully designed and applied in near-infrared (NIR) image encryption. Furthermore, an identity verification was proposed by binary encoding the current from different NIR and ultraviolet (UV) illumination combinations. Finally, a photoelectric watermark scheme responsive to UV light was proposed leveraging NIR’s non-volatile programming. The integration of a secure sensor strategy that encompasses image encryption, identity verification, and photoelectric watermark addresses the need for enhanced data protection and offering a comprehensive security solution for the Internet of Things (IoT).","PeriodicalId":13198,"journal":{"name":"IEEE Electron Device Letters","volume":"45 10","pages":"1859-1862"},"PeriodicalIF":4.1000,"publicationDate":"2024-08-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Electron Device Letters","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10643092/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Herein, In
2
O
3
/Al
2
O
3
/Y
6
transistors exhibiting bidirectional photoresponse (BPR) characteristic were fabricated. By utilizing this feature, XOR optoelectronic logic gate was successfully designed and applied in near-infrared (NIR) image encryption. Furthermore, an identity verification was proposed by binary encoding the current from different NIR and ultraviolet (UV) illumination combinations. Finally, a photoelectric watermark scheme responsive to UV light was proposed leveraging NIR’s non-volatile programming. The integration of a secure sensor strategy that encompasses image encryption, identity verification, and photoelectric watermark addresses the need for enhanced data protection and offering a comprehensive security solution for the Internet of Things (IoT).
期刊介绍：
IEEE Electron Device Letters publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors.
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