Relation between Deese-Roediger-Mcdermott recall measures of false memory and the fading affect bias

Abstract

The fading affect bias (FAB) is the faster fading of unpleasant affect than pleasant affect for autobiographical event memories, and it is considered a healthy coping mechanism because it is positively related to healthy measures (e.g., self-esteem and positive PANAS), whereas it is negatively related to unhealthy measures (e.g., psychological distress and negative PANAS). Some researchers suggest that Deese-Roediger McDermott (DRM) critical lure false memories for words are conceptually equivalent to false memories for autobiographical event memories, which has not been examined. Based on the finding that false autobiographical event memories negatively predict FAB, the current study tested if false DRM word memories would negatively predict FAB for autobiographical event memories, which would demonstrate support for the conceptual equivalence of DRM memories and autobiographical event memories. We found that three measures of false word recall positively predicted FAB, which is a result that is contrary to prior findings and the contention that DRM false memories for words are conceptually the same as autobiographical event memories.