Polarization of Diffraction Radiation of a Bunch of Charged Particles on a Metal Sphere

V. V. Syshchenko, A. I. Tarnovsky
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Abstract

Diffraction radiation is widely used for the nondestructive diagnostics of charged particle beams. In the series of previous works, a method was developed for describing the diffraction radiation of a nonrelativistic particle on a perfectly conducting sphere, based on the method of images well-known from electrostatics. This method allows one to derive the analytic formulas for two main radiation characteristics, i.e., spectral angular density and polarization. The characteristic features of these values allow the possibility of developing, on their basis, new methods for monitoring the parameters of the trajectory of a moving particle in relation to the sphere center. In this work, formulas are obtained that describe the polarization of the coherent diffraction radiation on a metal sphere from a pancake-bunch of charged particles. It is shown that the polarization of the radiation in this case makes it possible to estimate the positions of bunch edges relative to the center of the sphere. This can be used for the nondestructive measurement of characteristic bunch dimensions.

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金属球上一束带电粒子的衍射辐射极化
衍射辐射被广泛用于带电粒子束的无损诊断。在之前的一系列研究中,我们基于众所周知的静电学图像方法,开发出了一种描述完全导电球体上非相对论粒子衍射辐射的方法。通过这种方法,我们可以推导出两个主要辐射特征的解析公式,即光谱角密度和偏振。根据这些值的特征,可以开发出新的方法,用于监测运动粒子相对于球心的轨迹参数。在这项研究中,我们获得了描述带电粒子团在金属球上的相干衍射辐射极化的公式。研究表明,在这种情况下,辐射的偏振可以估算出粒子束边缘相对于球心的位置。这可用于无损测量带电粒子束的特征尺寸。
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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