Analysis of the Phospholipid Transport Nanosystem Structure Using Small-Angle X-ray Scattering

V. A. Maslova, M. A. Kiselev, P. V. Zhuchkov, Yu. A. Tereshkina, E. G. Tikhonova
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Abstract

The structure of aqueous dispersions of phospholipid transport nanosystem (PhTNS) based on soybean phospholipids developed at the Institute of Biomedical Chemistry (Moscow, Russia) was studied by the method of small-angle X-ray scattering. The PhTNS concentrations in water were 20, 25, 31.25, and 37.5%. The structural parameters of vesicles (inner radius, thicknesses of the regions of hydrophobic tails and polar heads) were determined in the “core/multi-shell model” approximation with variations in the scattering length densities of vesicle different parts, as well as the solution that was inside and outside the vesicle. A difference in the photon scattering length densities was detected between the solution volume and the inner region of the vesicle due to the uneven maltose dissolution, which was part of PhTNS. With an almost constant thickness of the lipid bilayer, a decrease in the vesicle radius from ~150 to ~130 Å was observed with increasing concentration of the system which was due to increasing osmotic pressure. The hydrophobic volume of vesicles was determined to be 7.45 × 106 Å3 at the lowest concentrations of 20% and 5.85 × 106 Å3 at the highest concentration of 37.5%.

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利用小角 X 射线散射分析磷脂传输纳米系统结构
通过小角 X 射线散射法研究了生物医学化学研究所(俄罗斯莫斯科)开发的基于大豆磷脂的磷脂传输纳米系统(PhTNS)水分散体的结构。PhTNS 在水中的浓度分别为 20%、25%、31.25% 和 37.5%。根据 "核心/多壳模型 "近似值确定了囊泡的结构参数(内半径、疏水尾部和极性头部区域的厚度),囊泡各部分以及囊泡内部和外部溶液的散射长度密度发生了变化。由于麦芽糖溶解不均匀,光子散射长度密度在溶液体积和囊泡内部区域之间存在差异,这是 PhTNS 的一部分。在脂质双分子层厚度几乎不变的情况下,随着体系浓度的增加,观察到囊泡半径从约 150 Å 减小到约 130 Å,这是由于渗透压增加所致。根据测定,在 20% 的最低浓度下,囊泡的疏水性体积为 7.45 × 106 Å3,而在 37.5% 的最高浓度下,囊泡的疏水性体积为 5.85 × 106 Å3。
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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