V. A. Maslova, M. A. Kiselev, P. V. Zhuchkov, Yu. A. Tereshkina, E. G. Tikhonova
{"title":"Analysis of the Phospholipid Transport Nanosystem Structure Using Small-Angle X-ray Scattering","authors":"V. A. Maslova, M. A. Kiselev, P. V. Zhuchkov, Yu. A. Tereshkina, E. G. Tikhonova","doi":"10.1134/S1027451024700666","DOIUrl":null,"url":null,"abstract":"<p>The structure of aqueous dispersions of phospholipid transport nanosystem (PhTNS) based on soybean phospholipids developed at the Institute of Biomedical Chemistry (Moscow, Russia) was studied by the method of small-angle X-ray scattering. The PhTNS concentrations in water were 20, 25, 31.25, and 37.5%. The structural parameters of vesicles (inner radius, thicknesses of the regions of hydrophobic tails and polar heads) were determined in the “core/multi-shell model” approximation with variations in the scattering length densities of vesicle different parts, as well as the solution that was inside and outside the vesicle. A difference in the photon scattering length densities was detected between the solution volume and the inner region of the vesicle due to the uneven maltose dissolution, which was part of PhTNS. With an almost constant thickness of the lipid bilayer, a decrease in the vesicle radius from ~150 to ~130 Å was observed with increasing concentration of the system which was due to increasing osmotic pressure. The hydrophobic volume of vesicles was determined to be 7.45 × 10<sup>6</sup> Å<sup>3</sup> at the lowest concentrations of 20% and 5.85 × 10<sup>6</sup> Å<sup>3</sup> at the highest concentration of 37.5%.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"18 4","pages":"929 - 935"},"PeriodicalIF":0.5000,"publicationDate":"2024-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1134/S1027451024700666","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
引用次数: 0
Abstract
The structure of aqueous dispersions of phospholipid transport nanosystem (PhTNS) based on soybean phospholipids developed at the Institute of Biomedical Chemistry (Moscow, Russia) was studied by the method of small-angle X-ray scattering. The PhTNS concentrations in water were 20, 25, 31.25, and 37.5%. The structural parameters of vesicles (inner radius, thicknesses of the regions of hydrophobic tails and polar heads) were determined in the “core/multi-shell model” approximation with variations in the scattering length densities of vesicle different parts, as well as the solution that was inside and outside the vesicle. A difference in the photon scattering length densities was detected between the solution volume and the inner region of the vesicle due to the uneven maltose dissolution, which was part of PhTNS. With an almost constant thickness of the lipid bilayer, a decrease in the vesicle radius from ~150 to ~130 Å was observed with increasing concentration of the system which was due to increasing osmotic pressure. The hydrophobic volume of vesicles was determined to be 7.45 × 106 Å3 at the lowest concentrations of 20% and 5.85 × 106 Å3 at the highest concentration of 37.5%.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.