V. N. Marin, D. N. Trunov, V. S. Litvin, R. A. Sadykov, E. V. Altynbaev
{"title":"Read-Out System for Thermal Neutron Detectors Based on ZnS(Ag)/LiF Scintillator","authors":"V. N. Marin, D. N. Trunov, V. S. Litvin, R. A. Sadykov, E. V. Altynbaev","doi":"10.1134/S1027451024700617","DOIUrl":null,"url":null,"abstract":"<p>Neutron scintillation detectors based on ZnS(Ag)/LiF, solid-state photomultipliers, and an organic glass light guide developed at the Institute for Nuclear Research, Russian Academy of Sciences (INR RAS) are successfully used in neutron diffractometers facilities at the INR RAS as a replacement for standard counters based on <sup>3</sup>He. These detectors use optical light guides with diffuse reflection, which makes it possible to multiply the recorded signal (up to 95 photoelectrons) in comparison with detectors with wavelength shifting fibers. The article describes two types of bias circuit for silicon photomultipliers. A method of dynamic bias has been proposed, which makes it possible to reduce the recovery time of a silicon photomultiplier and to increase the loading capacity of neutron detectors by a factor of 8. Simulation and comparison of two types of preamplifiers showed an increase in the loading capacity. The new electronics makes it possible to increase the loading capacity of the detectors up to 400 kHz. A circuit for digital control of discrimination thresholds has been developed and described. A new data acquisition system for time-of-flight neutron diffractometers for 80 detectors with the possibility of scaling has been developed.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"18 4","pages":"894 - 899"},"PeriodicalIF":0.5000,"publicationDate":"2024-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1134/S1027451024700617","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
引用次数: 0
Abstract
Neutron scintillation detectors based on ZnS(Ag)/LiF, solid-state photomultipliers, and an organic glass light guide developed at the Institute for Nuclear Research, Russian Academy of Sciences (INR RAS) are successfully used in neutron diffractometers facilities at the INR RAS as a replacement for standard counters based on 3He. These detectors use optical light guides with diffuse reflection, which makes it possible to multiply the recorded signal (up to 95 photoelectrons) in comparison with detectors with wavelength shifting fibers. The article describes two types of bias circuit for silicon photomultipliers. A method of dynamic bias has been proposed, which makes it possible to reduce the recovery time of a silicon photomultiplier and to increase the loading capacity of neutron detectors by a factor of 8. Simulation and comparison of two types of preamplifiers showed an increase in the loading capacity. The new electronics makes it possible to increase the loading capacity of the detectors up to 400 kHz. A circuit for digital control of discrimination thresholds has been developed and described. A new data acquisition system for time-of-flight neutron diffractometers for 80 detectors with the possibility of scaling has been developed.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.