Read-Out System for Thermal Neutron Detectors Based on ZnS(Ag)/LiF Scintillator

V. N. Marin, D. N. Trunov, V. S. Litvin, R. A. Sadykov, E. V. Altynbaev
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Abstract

Neutron scintillation detectors based on ZnS(Ag)/LiF, solid-state photomultipliers, and an organic glass light guide developed at the Institute for Nuclear Research, Russian Academy of Sciences (INR RAS) are successfully used in neutron diffractometers facilities at the INR RAS as a replacement for standard counters based on 3He. These detectors use optical light guides with diffuse reflection, which makes it possible to multiply the recorded signal (up to 95 photoelectrons) in comparison with detectors with wavelength shifting fibers. The article describes two types of bias circuit for silicon photomultipliers. A method of dynamic bias has been proposed, which makes it possible to reduce the recovery time of a silicon photomultiplier and to increase the loading capacity of neutron detectors by a factor of 8. Simulation and comparison of two types of preamplifiers showed an increase in the loading capacity. The new electronics makes it possible to increase the loading capacity of the detectors up to 400 kHz. A circuit for digital control of discrimination thresholds has been developed and described. A new data acquisition system for time-of-flight neutron diffractometers for 80 detectors with the possibility of scaling has been developed.

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基于 ZnS(Ag)/LiF 闪烁器的热中子探测器读出系统
俄罗斯科学院核研究所(INR RAS)开发的基于 ZnS(Ag)/LiF 的中子闪烁探测器、固态光电倍增管和有机玻璃光导器已成功用于该研究所的中子衍射仪设施,以替代基于 3He 的标准计数器。这些探测器使用具有漫反射功能的光学导光板,与使用波长偏移光纤的探测器相比,可以使记录的信号(多达 95 个光电子)成倍增加。文章介绍了硅光电倍增管的两种偏置电路。文章提出了一种动态偏置方法,它可以缩短硅光电倍增管的恢复时间,并将中子探测器的负载能力提高 8 倍。 对两种前置放大器的模拟和比较表明,负载能力有所提高。新的电子设备可以将探测器的负载能力提高到 400 kHz。还开发并描述了用于数字控制分辨阈值的电路。为 80 个探测器的飞行时间中子衍射仪开发了一种新的数据采集系统,可进行扩展。
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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