D. N. Trunov, V. N. Marin, R. A. Sadykov, E. V. Altynbaev, T. I. Glushkova
{"title":"Development of a Linear Position-Sensitive Scintillation Neutron Detector Based on ZnS(Ag):6Li and Silicon Photomultipliers","authors":"D. N. Trunov, V. N. Marin, R. A. Sadykov, E. V. Altynbaev, T. I. Glushkova","doi":"10.1134/S1027451024700599","DOIUrl":null,"url":null,"abstract":"<p>A linear position-sensitive neutron detector based on two silicon photomultipliers and an organic light guide has been developed. Determination of the coordinate of the neutron hitting the detector comes from analyzing the amplitude of the signal received from two silicon photomultipliers located at the ends of the light guide. The results of measurements using a collimated <sup>252</sup>Cf source and two types of detectors based on silicon photomultipliers from Sensl with a diffusion reflector and from Hamamatsu without and with a diffusion reflector are presented. Signals from silicon photomultipliers are recorded using an analog-to-digital converter. The neutron impact coordinates are analyzed using the amplitude characteristics of the photosignal. For a detector based on silicon photomultiplier from Sensl, there is no obvious dependence of the signal amplitude on the coordinate of the neutron detection event, in contrast to detectors from Hamamatsu. The resolution of the detector coated with a diffusion reflector is about 10 mm, and without the diffusion reflector it is approximately 5 mm.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"18 4","pages":"881 - 886"},"PeriodicalIF":0.5000,"publicationDate":"2024-09-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1134/S1027451024700599","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
引用次数: 0
Abstract
A linear position-sensitive neutron detector based on two silicon photomultipliers and an organic light guide has been developed. Determination of the coordinate of the neutron hitting the detector comes from analyzing the amplitude of the signal received from two silicon photomultipliers located at the ends of the light guide. The results of measurements using a collimated 252Cf source and two types of detectors based on silicon photomultipliers from Sensl with a diffusion reflector and from Hamamatsu without and with a diffusion reflector are presented. Signals from silicon photomultipliers are recorded using an analog-to-digital converter. The neutron impact coordinates are analyzed using the amplitude characteristics of the photosignal. For a detector based on silicon photomultiplier from Sensl, there is no obvious dependence of the signal amplitude on the coordinate of the neutron detection event, in contrast to detectors from Hamamatsu. The resolution of the detector coated with a diffusion reflector is about 10 mm, and without the diffusion reflector it is approximately 5 mm.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.