M. V. Dyachkov, V. A. Matveev, V. G. Syromyatnikov, V. V. Tarnavich, V. A. Ulyanov
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引用次数: 0
Abstract
The paper briefly describes the main units of TNR and NERO-2 neutron reflectometers installed in the hall of horizontal experimental channels of the new high-flux PIK reactor (PNPI, National Research Center “Kurchatov Institute”) as part of the program for commissioning the first five stations of the instrument base of this reactor. TNR and NERO-2 neutron reflectometers are designed for conducting studies of the magnetic and nonmagnetic multilayer nanostructures, including certification of neutron-optical elements for the neutron stations. The TNR has the ability to work in measurement modes with “white” unpolarized/polarized beams and with monochromatic unpolarized/polarized neutron beams (wavelengths from 0.09 to 0.5 nm). NERO-2 is a high-resolution reflectometer with a fixed wavelength and the ability to work with both unpolarized and polarized monochromatic beams. The paper discusses the results of the first measurements of neutron-optical samples on a glass substrates carried out on TNR and NERO-2 reflectometers at the start of the PIK reactor at a power of 7 MW. Measurements were carried out on TNR with a supermirror, which is an aperiodic multilayer nanosystem of 171 pairs of alternating Ni and Ti layers (m = 2.5). On NERO-2, measurements were carried out with a mirror monochromator, which is a periodic multilayer nanosystem of 60 pairs of alternating NiMo and Ti layers with a thickness of 60 Å each.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.