Quantitative Analysis of the Dispersion Interaction of Liquids with the Surface of Gamma-Irradiated PTFE

IF 0.5 Q4 PHYSICS, CONDENSED MATTER Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques Pub Date : 2024-09-26 DOI:10.1134/S1027451024700459

A. Yu. Obvintsev, S. A. Serov, S. A. Khatipov, N. V. Sadovskaya

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Abstract

The Hamaker constants are calculated for the PTFE/PTFE, PTFE/tetradecane, and PTFE/water (PTFE is polytetrafluoroethylene) systems using various dielectric models. Selection of the dielectric model significantly affects the absolute values of the Hamaker constants while it has virtually no effect on their relative changes depending on the density and dielectric increment of PTFE. The total calculated changes in the work of adhesion due to van der Waals interactions, taking into account changes in density and dielectric increment in gamma-irradiated PTFE, do not exceed 11% for all dielectric models used. It is concluded that changes in surface energy upon the irradiation of PTFE cannot be explained solely by an increase in the contribution of the van der Waals interaction due to polar radiolysis products. It is necessary to consider the electrostatic interaction of stabilized charges with the dipoles of a polar liquid.

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定量分析液体与伽马射线辐照聚四氟乙烯表面的分散相互作用

使用各种介电模型计算了 PTFE/PTFE、PTFE/十四烷和 PTFE/水（PTFE 即聚四氟乙烯）体系的 Hamaker 常量。介电模型的选择对 Hamaker 常数的绝对值有很大影响，而对其相对变化则几乎没有影响，这取决于 PTFE 的密度和介电增量。考虑到伽马射线照射下 PTFE 密度和介电强度的变化，在所有使用的介电模型中，范德华相互作用引起的粘附功的总变化计算值不超过 11%。结论是，聚四氟乙烯经辐照后表面能的变化不能仅用极性辐射分解产物导致的范德华相互作用的增加来解释。有必要考虑稳定电荷与极性液体偶极子的静电相互作用。

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来源期刊

Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques PHYSICS, CONDENSED MATTER-

CiteScore

0.90

自引率

25.00%

发文量

144

审稿时长

3-8 weeks

期刊介绍： Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.