A low-power common-mode insensitive rail-to-rail dynamic comparator for ADCs

IF 2.2 3区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE Integration-The Vlsi Journal Pub Date : 2024-10-05 DOI:10.1016/j.vlsi.2024.102288
Nidhi Sharma , Rajesh Kumar Srivastava , Deep Sehgal , Devarshi Mrinal Das
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Abstract

This paper presents a low-power, high-speed dynamic comparator with a rail-to-rail input common-mode (Vi,cm) range. The proposed comparator has high-speed performance throughout the 0-Vdd Vi,cm range, thus attributing common-mode insensitivity. This work introduces a merger of NMOS and PMOS dynamic pre-amplifiers with a modified latch to achieve the rail-to-rail Vi,cm operation. A novel activation clock logic is also proposed, activating only one pre-amplifier based on the Vi,cm value and ensuring low-power consumption and provides reduction of 17% in the energy per conversion as compared to the comparator without activation clock logic. The proposed comparator is designed using 65-nm CMOS technology with a 1.2 V supply voltage and is operating at 1 GHz frequency. We have presented the analytical models of the delay and offset which is verified with the rigorous post-layout simulation results. To validate the robustness of the proposed comparator, the PVT corner analysis with Monte Carlo simulation is also performed for different Vi,cm.
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用于 ADC 的低功耗共模不敏感轨至轨动态比较器
本文介绍了一种具有轨至轨输入共模 (Vi,cm) 范围的低功耗、高速动态比较器。所提出的比较器在整个 0-Vdd Vi,cm 范围内都具有高速性能,因此具有共模不敏感性。这项工作将 NMOS 和 PMOS 动态前置放大器与改进型锁存器合并,以实现轨至轨 Vi,cm 操作。此外,还提出了一种新颖的激活时钟逻辑,根据 Vi,cm 值只激活一个前置放大器,确保低功耗,与没有激活时钟逻辑的比较器相比,每次转换的能耗降低了 17%。拟议的比较器采用 65 纳米 CMOS 技术设计,电源电压为 1.2 V,工作频率为 1 GHz。我们提出了延迟和偏移的分析模型,并通过严格的布局后仿真结果进行了验证。为了验证拟议比较器的鲁棒性,我们还针对不同的 Vi、cm 进行了蒙特卡罗仿真的 PVT 角分析。
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来源期刊
Integration-The Vlsi Journal
Integration-The Vlsi Journal 工程技术-工程:电子与电气
CiteScore
3.80
自引率
5.30%
发文量
107
审稿时长
6 months
期刊介绍: Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.
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