Efficient and cost-effective maximum power point tracking technique for solar photovoltaic systems with Li-ion battery charging

IF 2.2 3区工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE Integration-The Vlsi Journal Pub Date : 2024-10-13 DOI:10.1016/j.vlsi.2024.102298

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Abstract

This paper presents an effective approach to achieve maximum power point tracking (MPPT) in photovoltaic (PV) systems for battery charging using a single-sensor incremental conductance (InC) method. The objective is to optimize the MPPT process while minimizing the number of sensors required. The suggested technique leverages the relationship between the PV module's output voltage and the duty cycle to automatically adjust and reach the MPP, resulting in optimal power generation. By eliminating the PV current sensor from the control circuit, the developed method reduces both the cost and size of the MPPT circuit. Compared to the conventional InC method, the developed approach demonstrates improved response speed and accuracy in steady-state operation, along with the ability to damp oscillations near the MPP. Extensive simulations using MATLAB/Simulink validate the performance of the developed technique across various environmental conditions. The results highlight the recommended method's realistic and effective MPP tracking capabilities, achieving higher efficiency (99.12 %) compared to the classical method (97.8 %) under high irradiance levels.

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针对锂离子电池充电太阳能光伏系统的高效、经济的最大功率点跟踪技术

本文提出了一种有效的方法，利用单传感器增量电导（InC）方法实现光伏（PV）系统中的最大功率点跟踪（MPPT），为电池充电。目标是优化 MPPT 过程，同时尽量减少所需的传感器数量。所建议的技术利用光伏模块输出电压与占空比之间的关系，自动调整并达到 MPP，从而实现最佳发电效果。通过消除控制电路中的光伏电流传感器，所开发的方法降低了 MPPT 电路的成本和体积。与传统的 InC 方法相比，所开发的方法提高了稳态运行的响应速度和精度，并能抑制 MPP 附近的振荡。使用 MATLAB/Simulink 进行的大量仿真验证了所开发技术在各种环境条件下的性能。结果凸显了所推荐方法真实有效的 MPP 跟踪能力，在高辐照度条件下，与传统方法（97.8%）相比，效率更高（99.12%）。

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来源期刊

Integration-The Vlsi Journal 工程技术-工程：电子与电气

CiteScore

3.80

自引率

5.30%

发文量

107

审稿时长

6 months

期刊介绍： Integration''s aim is to cover every aspect of the VLSI area, with an emphasis on cross-fertilization between various fields of science, and the design, verification, test and applications of integrated circuits and systems, as well as closely related topics in process and device technologies. Individual issues will feature peer-reviewed tutorials and articles as well as reviews of recent publications. The intended coverage of the journal can be assessed by examining the following (non-exclusive) list of topics: Specification methods and languages; Analog/Digital Integrated Circuits and Systems; VLSI architectures; Algorithms, methods and tools for modeling, simulation, synthesis and verification of integrated circuits and systems of any complexity; Embedded systems; High-level synthesis for VLSI systems; Logic synthesis and finite automata; Testing, design-for-test and test generation algorithms; Physical design; Formal verification; Algorithms implemented in VLSI systems; Systems engineering; Heterogeneous systems.