{"title":"Generalized Mean Robustness for Signal Temporal Logic","authors":"Noushin Mehdipour;Cristian-Ioan Vasile;Calin Belta","doi":"10.1109/TAC.2024.3482104","DOIUrl":null,"url":null,"abstract":"Robustness functions provide quantitative scores to measure the satisfaction of temporal logic formulas. We introduce a general class of parameterized robustness functions for signal temporal logic (STL), and demonstrate how it can be used for control problems involving STL specifications. We employ power means and generalized functional means to capture robust satisfaction over space and time. We show that our general definition encompasses many of the STL robustness functions in the literature. Most importantly, we show how that our notion of robustness addresses the two main limitations of the the traditional robustness (masking and locality), which currently limit using robustness-based approaches for control. The proposed robustness function parameters affect the conservativeness of the score, and can be chosen based on desired performance. We show how the proposed robustness can be used for control.","PeriodicalId":13201,"journal":{"name":"IEEE Transactions on Automatic Control","volume":"70 3","pages":"1949-1956"},"PeriodicalIF":7.0000,"publicationDate":"2024-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Automatic Control","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10720092/","RegionNum":1,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"AUTOMATION & CONTROL SYSTEMS","Score":null,"Total":0}
引用次数: 0
Abstract
Robustness functions provide quantitative scores to measure the satisfaction of temporal logic formulas. We introduce a general class of parameterized robustness functions for signal temporal logic (STL), and demonstrate how it can be used for control problems involving STL specifications. We employ power means and generalized functional means to capture robust satisfaction over space and time. We show that our general definition encompasses many of the STL robustness functions in the literature. Most importantly, we show how that our notion of robustness addresses the two main limitations of the the traditional robustness (masking and locality), which currently limit using robustness-based approaches for control. The proposed robustness function parameters affect the conservativeness of the score, and can be chosen based on desired performance. We show how the proposed robustness can be used for control.
期刊介绍:
In the IEEE Transactions on Automatic Control, the IEEE Control Systems Society publishes high-quality papers on the theory, design, and applications of control engineering. Two types of contributions are regularly considered:
1) Papers: Presentation of significant research, development, or application of control concepts.
2) Technical Notes and Correspondence: Brief technical notes, comments on published areas or established control topics, corrections to papers and notes published in the Transactions.
In addition, special papers (tutorials, surveys, and perspectives on the theory and applications of control systems topics) are solicited.