Nanopetal-Assembled SnS Flower-Based Vis–NIR Photodetector

IF 4.7 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC ACS Applied Electronic Materials Pub Date : 2024-10-01 DOI:10.1021/acsaelm.4c01133
Prashant Kumar Gupta, Yashwant Puri Goswami and Amritanshu Pandey*, 
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Abstract

This paper reports a simple, low-cost, and high-performance two-dimensional (2D) nanopetal-assembled three-dimensional (3D) SnS flowers/Si heterojunction-based visible–near-infrared (vis–NIR) photodetector (PD). A modified chemical bath deposition (CBD) method was used to grow a uniform and closely spaced array of SnS flowers on a Si substrate. This type of nanostructure offers a large photoactive area, thus generating a large number of carriers. The high-performance parameters of the fabricated PD (responsivity, 68.21 A/W; external quantum efficiency (EQE), 1.32 × 104%; detectivity, 6.87 × 1013 Jones; rise time, 193.91 ms; and fall time, 94.19 ms at 635 nm) are attributed to the heterojunction characteristics resulting from closely spaced nanopetal-assembled SnS flowers on silicon.

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纳米金属组装的 SnS 花型可见近红外光电探测器
本文报告了一种简单、低成本、高性能的二维(2D)纳米金属片组装的三维(3D)SnS 花/硅异质结可见光-近红外(vis-NIR)光电探测器(PD)。采用改良的化学沉积(CBD)方法在硅衬底上生长出均匀且间距紧密的SnS花阵列。这种纳米结构具有较大的光活性面积,因此能产生大量载流子。所制造的 PD 的高性能参数(响应率,68.21 A/W;外部量子效率 (EQE),1.32 × 104%;检测率,6.87 × 1013 Jones;上升时间,193.91 ms;以及在 635 nm 波长处的下降时间,94.19 ms)归功于硅上紧密间隔的纳米金属片组装的 SnS 花所产生的异质结特性。
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来源期刊
CiteScore
7.20
自引率
4.30%
发文量
567
期刊介绍: ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/​Abstracted: Web of Science SCIE Scopus CAS INSPEC Portico
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