Ray-tracing-based three-dimensional profilometry using fringe projection

IF 2 3区 物理与天体物理 Q3 OPTICS Applied Physics B Pub Date : 2024-10-23 DOI:10.1007/s00340-024-08333-7
Chao Chen, Han Luo, Jianwei Gan, Ya Kong, Bingxue Yi, Xinyu Chen, Zhaonan Li
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Abstract

A fringe projection system, in special application scenarios, is used for three-dimensional (3D) shape measurement through a transparent medium. The light refraction caused by the medium gives rise to erroneous 3D data in conventional fringe projection methods. In this work, we propose ray-tracing-based 3D profilometry using fringe projection. The method uses phase information for seeking the homologous points between camera images and projector images pixel by pixel. Equations of light rays emitted from each point pair are identified with the law of flat refraction. A midpoint of skew lines common perpendicular algorithm is developed for calculating the intersections of these equations, which are 3D shape data without refraction error. For validation, a fringe projection system through a transparent glass was set up and applied for 3D shape measurements. The results verify the effectiveness and accuracy of the proposed ray-tracing-based 3D profilometry.

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利用条纹投影进行基于光线跟踪的三维轮廓测量
在特殊应用场景中,条纹投影系统用于通过透明介质进行三维(3D)形状测量。在传统的条纹投影方法中,介质引起的光折射会导致三维数据错误。在这项工作中,我们利用条纹投影提出了基于光线跟踪的三维轮廓测量法。该方法利用相位信息来逐个像素地寻找相机图像和投影仪图像之间的同源点。从每个点对发出的光线的方程都是根据平面折射定律确定的。为计算这些等式的交叉点,开发了一种斜线中点共同垂直算法,即无折射误差的三维形状数据。为进行验证,建立了一个穿过透明玻璃的边缘投影系统,并将其用于三维形状测量。结果验证了所提出的基于光线跟踪的三维轮廓测量法的有效性和准确性。
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来源期刊
Applied Physics B
Applied Physics B 物理-光学
CiteScore
4.00
自引率
4.80%
发文量
202
审稿时长
3.0 months
期刊介绍: Features publication of experimental and theoretical investigations in applied physics Offers invited reviews in addition to regular papers Coverage includes laser physics, linear and nonlinear optics, ultrafast phenomena, photonic devices, optical and laser materials, quantum optics, laser spectroscopy of atoms, molecules and clusters, and more 94% of authors who answered a survey reported that they would definitely publish or probably publish in the journal again Publishing essential research results in two of the most important areas of applied physics, both Applied Physics sections figure among the top most cited journals in this field. In addition to regular papers Applied Physics B: Lasers and Optics features invited reviews. Fields of topical interest are covered by feature issues. The journal also includes a rapid communication section for the speedy publication of important and particularly interesting results.
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