{"title":"A novel analog circuit fault diagnosis method based on multi-channel 1D-resnet and wavelet packet transform","authors":"Xin Zhou, Xuanzhong Tang, Wenhai Liang","doi":"10.1007/s10470-024-02291-y","DOIUrl":null,"url":null,"abstract":"<div><p>To quickly and accurately locate the fault location and fault parameter deviation of analog circuits, a novel incipient fault diagnosis method based on multi-channel one-dimensional residual networks (MC-1D-ResNet) and wavelet packet transform(WPT) is proposed in this paper. The WPT is employed to preprocess the time-domain response signals of analog circuit, and the proposed MC-1D-ResNet is utilized for feature mining and fault classification.The two-level WPT is first carried out on the time-domain response signal to generate one approximate signal and three detailed signals. Secondly, MC-1D-ResNet further performs feature mining on approximate signals and three detailed signals, and realizes fault diagnosis. Through simulation analysis, the proposed method is fully evaluated with the Sallen-Key bandpass filter circuit and the four-op-amp biquad high-pass filter circuit. Even in complex Four-op-amp biquad high-pass filtering circuits, the diagnostic accuracy can reach 99.74%. This article also designs a hardware testing platform based on FPGA, and conduct actual fault diagnosis tests on the four-op-amp biquad high-pass filter circuit. The results show that the average accuracy of 50 actual diagnoses for each type of fault in the circuit was 97.80%.</p></div>","PeriodicalId":7827,"journal":{"name":"Analog Integrated Circuits and Signal Processing","volume":"121 1-3","pages":"25 - 38"},"PeriodicalIF":1.2000,"publicationDate":"2024-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Analog Integrated Circuits and Signal Processing","FirstCategoryId":"5","ListUrlMain":"https://link.springer.com/article/10.1007/s10470-024-02291-y","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
To quickly and accurately locate the fault location and fault parameter deviation of analog circuits, a novel incipient fault diagnosis method based on multi-channel one-dimensional residual networks (MC-1D-ResNet) and wavelet packet transform(WPT) is proposed in this paper. The WPT is employed to preprocess the time-domain response signals of analog circuit, and the proposed MC-1D-ResNet is utilized for feature mining and fault classification.The two-level WPT is first carried out on the time-domain response signal to generate one approximate signal and three detailed signals. Secondly, MC-1D-ResNet further performs feature mining on approximate signals and three detailed signals, and realizes fault diagnosis. Through simulation analysis, the proposed method is fully evaluated with the Sallen-Key bandpass filter circuit and the four-op-amp biquad high-pass filter circuit. Even in complex Four-op-amp biquad high-pass filtering circuits, the diagnostic accuracy can reach 99.74%. This article also designs a hardware testing platform based on FPGA, and conduct actual fault diagnosis tests on the four-op-amp biquad high-pass filter circuit. The results show that the average accuracy of 50 actual diagnoses for each type of fault in the circuit was 97.80%.
期刊介绍:
Analog Integrated Circuits and Signal Processing is an archival peer reviewed journal dedicated to the design and application of analog, radio frequency (RF), and mixed signal integrated circuits (ICs) as well as signal processing circuits and systems. It features both new research results and tutorial views and reflects the large volume of cutting-edge research activity in the worldwide field today.
A partial list of topics includes analog and mixed signal interface circuits and systems; analog and RFIC design; data converters; active-RC, switched-capacitor, and continuous-time integrated filters; mixed analog/digital VLSI systems; wireless radio transceivers; clock and data recovery circuits; and high speed optoelectronic circuits and systems.