{"title":"Fast complete Mueller matrix polarimetry microscopy using a single polarization camera","authors":"Tao Wang , Nan Wang , Sailing He","doi":"10.1016/j.optlaseng.2024.108650","DOIUrl":null,"url":null,"abstract":"<div><div>We propose a fast microscopic polarimeter for complete Mueller matrix imaging by using two rotating retarders and one polarization camera. Our new design allows us to compute the full Mueller matrix by 6 measurements in only ∼1.4s. The acquisition time is reduced by optimizing the sampling process. At the same time, the measurement precision is enhanced by minimizing the conditional numbers of the measurement matrices, compensating the pixel displacement, and calibrating the orientation of each polarization component in the system. As a demonstration, we use our fast polarimetry microscopy to measure the complete Mueller matrix for a garnet sample and cholesteric liquid crystal samples.</div></div>","PeriodicalId":49719,"journal":{"name":"Optics and Lasers in Engineering","volume":"184 ","pages":"Article 108650"},"PeriodicalIF":3.5000,"publicationDate":"2024-10-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optics and Lasers in Engineering","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0143816624006286","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"OPTICS","Score":null,"Total":0}
引用次数: 0
Abstract
We propose a fast microscopic polarimeter for complete Mueller matrix imaging by using two rotating retarders and one polarization camera. Our new design allows us to compute the full Mueller matrix by 6 measurements in only ∼1.4s. The acquisition time is reduced by optimizing the sampling process. At the same time, the measurement precision is enhanced by minimizing the conditional numbers of the measurement matrices, compensating the pixel displacement, and calibrating the orientation of each polarization component in the system. As a demonstration, we use our fast polarimetry microscopy to measure the complete Mueller matrix for a garnet sample and cholesteric liquid crystal samples.
期刊介绍：
Optics and Lasers in Engineering aims at providing an international forum for the interchange of information on the development of optical techniques and laser technology in engineering. Emphasis is placed on contributions targeted at the practical use of methods and devices, the development and enhancement of solutions and new theoretical concepts for experimental methods.
Optics and Lasers in Engineering reflects the main areas in which optical methods are being used and developed for an engineering environment. Manuscripts should offer clear evidence of novelty and significance. Papers focusing on parameter optimization or computational issues are not suitable. Similarly, papers focussed on an application rather than the optical method fall outside the journal''s scope. The scope of the journal is defined to include the following:
-Optical Metrology-
Optical Methods for 3D visualization and virtual engineering-
Optical Techniques for Microsystems-
Imaging, Microscopy and Adaptive Optics-
Computational Imaging-
Laser methods in manufacturing-
Integrated optical and photonic sensors-
Optics and Photonics in Life Science-
Hyperspectral and spectroscopic methods-
Infrared and Terahertz techniques
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