Pub Date : 2026-01-31DOI: 10.1016/j.optlaseng.2026.109668
Jiayu Chen , Yuehui Sun , Shede Chen , Pu Li , Liyun Zhong , Jianglei Di , Yuncai Wang
This paper introduces and experimentally validates a single-pixel imaging (SPI) system illuminated by a 90–140 GHz photonic noise source. The noise source, with a 36 dB excess noise ratio (ENR), proves to be an effective spatially-incoherent illuminator for SPI. High-fidelity reconstructions are achieved at sub-Nyquist sampling rates: the letters ”T” and ”H” attain structural similarity index (SSIM) values above 0.7 at 40–50% sampling, while the more complex letter ”Z” requires a 70% sampling rate to reach an SSIM of 0.6. A key finding is that noise illumination significantly outperforms conventional 100 GHz single-frequency coherent illumination, achieving over 30% improvement in SSIM at equivalent sampling rates. This enhancement is attributed to the effective suppression of coherent interference speckles by the noise source’s inherent randomness. Furthermore, we demonstrate the practical potential of this technique for security screening by successfully imaging a concealed metal blade.
{"title":"Noise imaging based on 90–140 GHz photonic noise source","authors":"Jiayu Chen , Yuehui Sun , Shede Chen , Pu Li , Liyun Zhong , Jianglei Di , Yuncai Wang","doi":"10.1016/j.optlaseng.2026.109668","DOIUrl":"10.1016/j.optlaseng.2026.109668","url":null,"abstract":"<div><div>This paper introduces and experimentally validates a single-pixel imaging (SPI) system illuminated by a 90–140 GHz photonic noise source. The noise source, with a 36 dB excess noise ratio (ENR), proves to be an effective spatially-incoherent illuminator for SPI. High-fidelity reconstructions are achieved at sub-Nyquist sampling rates: the letters ”T” and ”H” attain structural similarity index (SSIM) values above 0.7 at 40–50% sampling, while the more complex letter ”Z” requires a 70% sampling rate to reach an SSIM of 0.6. A key finding is that noise illumination significantly outperforms conventional 100 GHz single-frequency coherent illumination, achieving over 30% improvement in SSIM at equivalent sampling rates. This enhancement is attributed to the effective suppression of coherent interference speckles by the noise source’s inherent randomness. Furthermore, we demonstrate the practical potential of this technique for security screening by successfully imaging a concealed metal blade.</div></div>","PeriodicalId":49719,"journal":{"name":"Optics and Lasers in Engineering","volume":"201 ","pages":"Article 109668"},"PeriodicalIF":3.7,"publicationDate":"2026-01-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146079582","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2026-01-31DOI: 10.1016/j.optlaseng.2026.109635
Yuanhang Dou , Xuexi Cui , Xiangdong Wu , Min Wan
Digital Image Correlation (DIC) algorithm is widely used to measure the deformation of materials under load. Due to the inherent complexity of the DIC algorithm, high-sampling-rate measurement of displacement or deformation fields remains a significant challenge. We leverage the CUDA parallel computing environment of NVIDIA GPUs combined with an innovative DIC algorithm to improve processing speed. We divide all subsets in the measurement region into multiple levels, and analyze the motion characteristics of subsets in the image sequence. The deformation parameter initial values of other subsets are estimated using the results of already computed subsets, which greatly reduces the computational load for initial guesses. Additionally, this method enables the entire process of continuous computation to be executed on the GPU, avoiding frequent data exchange and CPU involvement. During the Inverse Compositional Gauss-Newton (IC-GN) iterative calculation, the L1 cache and thread resources of the GPU chip are fully utilized to enhance computing speed. The accuracy of the method was validated on the recognized DIC Challenge dataset. This proves that our method meets the measurement requirements. Achieved a maximum 2D full-field DIC measurement speed of over 6 × 106 points per second, or a stereo measurement rate exceeding 200 fps. The reliability of the algorithm in relevant experiments was verified using real uniaxial tensile, biaxial tensile, and vibration test images.
{"title":"An optimized GPU-accelerated digital image correlation algorithm","authors":"Yuanhang Dou , Xuexi Cui , Xiangdong Wu , Min Wan","doi":"10.1016/j.optlaseng.2026.109635","DOIUrl":"10.1016/j.optlaseng.2026.109635","url":null,"abstract":"<div><div>Digital Image Correlation (DIC) algorithm is widely used to measure the deformation of materials under load. Due to the inherent complexity of the DIC algorithm, high-sampling-rate measurement of displacement or deformation fields remains a significant challenge. We leverage the CUDA parallel computing environment of NVIDIA GPUs combined with an innovative DIC algorithm to improve processing speed. We divide all subsets in the measurement region into multiple levels, and analyze the motion characteristics of subsets in the image sequence. The deformation parameter initial values of other subsets are estimated using the results of already computed subsets, which greatly reduces the computational load for initial guesses. Additionally, this method enables the entire process of continuous computation to be executed on the GPU, avoiding frequent data exchange and CPU involvement. During the Inverse Compositional Gauss-Newton (IC-GN) iterative calculation, the L1 cache and thread resources of the GPU chip are fully utilized to enhance computing speed. The accuracy of the method was validated on the recognized DIC Challenge dataset. This proves that our method meets the measurement requirements. Achieved a maximum 2D full-field DIC measurement speed of over 6 × 10<sup>6</sup> points per second, or a stereo measurement rate exceeding 200 fps. The reliability of the algorithm in relevant experiments was verified using real uniaxial tensile, biaxial tensile, and vibration test images.</div></div>","PeriodicalId":49719,"journal":{"name":"Optics and Lasers in Engineering","volume":"201 ","pages":"Article 109635"},"PeriodicalIF":3.7,"publicationDate":"2026-01-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146079498","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2026-01-31DOI: 10.1016/j.optlaseng.2026.109667
Yuheng Li , Cixing Lv , Junwei Liang , Yi Qin , Jiale Li , Yunyao Zeng
Phase Shifting Profilometry (PSP) stands as a dominant technique within optical metrology for high-precision 3D measurement, yet its accuracy is fundamentally limited by the mixed Gaussian-Poisson (GP) noise, which necessitates highly effective denoising. However, existing methods suffer from limitations in computational efficiency and the effective use of physical priors. To overcome these limitations, this paper proposes a novel Computational-Efficient Denoising Framework via Variance Stabilization and Noise-adaptive Low-Rank Optimization, called CEDF-VSNLO. The proposed framework introduces a computational strategy that transforms the denoising task from processing phase-shifted fringe patterns to processing only two variance-stabilized sine/cosine component images. Since the number of processed images is fixed at two regardless of the phase shift steps , this approach decouples the computational cost from the shift steps, thereby achieving a fundamental reduction in complexity from linear to constant relative to . Additionally, the framework is further enhanced by an improved method for estimating the inherent Amplitude-Modulation and Frequency-Modulation (AM-FM) physical prior. Guided by the resulting AM-FM map, a two-stage clustering strategy is then employed to group image blocks based on their shared noise characteristics. This organization enables a final, noise-adaptive low-rank denoising process, where the regularization strength for each cluster is dynamically calibrated using its average AM-FM values to optimally balance noise suppression with structural fidelity. Simulations and real experiments demonstrate that the proposed CEDF-VSNLO framework significantly improves phase accuracy and structural fidelity, outperforming current state-of-the-art techniques.
{"title":"CEDF-VSNLO: A novel computational-efficient denoising framework via variance stabilization and noise-adaptive low-rank optimization for fringe patterns","authors":"Yuheng Li , Cixing Lv , Junwei Liang , Yi Qin , Jiale Li , Yunyao Zeng","doi":"10.1016/j.optlaseng.2026.109667","DOIUrl":"10.1016/j.optlaseng.2026.109667","url":null,"abstract":"<div><div>Phase Shifting Profilometry (PSP) stands as a dominant technique within optical metrology for high-precision 3D measurement, yet its accuracy is fundamentally limited by the mixed Gaussian-Poisson (GP) noise, which necessitates highly effective denoising. However, existing methods suffer from limitations in computational efficiency and the effective use of physical priors. To overcome these limitations, this paper proposes a novel Computational-Efficient Denoising Framework via Variance Stabilization and Noise-adaptive Low-Rank Optimization, called CEDF-VSNLO. The proposed framework introduces a computational strategy that transforms the denoising task from processing <span><math><mi>N</mi></math></span> phase-shifted fringe patterns to processing only two variance-stabilized sine/cosine component images. Since the number of processed images is fixed at two regardless of the phase shift steps <span><math><mi>N</mi></math></span>, this approach decouples the computational cost from the shift steps, thereby achieving a fundamental reduction in complexity from linear <span><math><mrow><mi>O</mi><mo>(</mo><mi>N</mi><mo>)</mo></mrow></math></span> to constant <span><math><mrow><mi>O</mi><mo>(</mo><mn>1</mn><mo>)</mo></mrow></math></span> relative to <span><math><mi>N</mi></math></span>. Additionally, the framework is further enhanced by an improved method for estimating the inherent Amplitude-Modulation and Frequency-Modulation (AM-FM) physical prior. Guided by the resulting AM-FM map, a two-stage clustering strategy is then employed to group image blocks based on their shared noise characteristics. This organization enables a final, noise-adaptive low-rank denoising process, where the regularization strength for each cluster is dynamically calibrated using its average AM-FM values to optimally balance noise suppression with structural fidelity. Simulations and real experiments demonstrate that the proposed CEDF-VSNLO framework significantly improves phase accuracy and structural fidelity, outperforming current state-of-the-art techniques.</div></div>","PeriodicalId":49719,"journal":{"name":"Optics and Lasers in Engineering","volume":"201 ","pages":"Article 109667"},"PeriodicalIF":3.7,"publicationDate":"2026-01-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146079580","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Wavefront reconstruction in lateral shearing interferometry typically assumes that the shear amount is an integer multiple of the sampling interval. When the shear is fractional, approximating it with the nearest integer value leads to noticeable reconstruction errors. To address this, we propose a weighted integer shear averaging method. The approach combines reconstructions from nearby integer shears with carefully chosen weights designed to cancel the dominant error terms. Analytical error analysis shows that two-shear averaging removes first-order errors, while three-shear averaging removes second-order errors. Numerical simulations with a test wavefront confirm that the method achieves significantly lower RMS error than conventional single-shear reconstruction. The technique is simple, computationally efficient, and can be readily extended to two-dimensional interferometry. This makes weighted integer shear averaging a practical and accurate tool for wavefront reconstruction when fractional shear is unavoidable.
{"title":"Wavefront reconstruction for fractional lateral shear measurements using weighted integer shear averages","authors":"Samia Heshmat , Satoshi Tomioka , Naoki Miyamoto , Yuji Yamauchi , Yutaka Matsumoto , Naoki Higashi","doi":"10.1016/j.optlaseng.2026.109664","DOIUrl":"10.1016/j.optlaseng.2026.109664","url":null,"abstract":"<div><div>Wavefront reconstruction in lateral shearing interferometry typically assumes that the shear amount is an integer multiple of the sampling interval. When the shear is fractional, approximating it with the nearest integer value leads to noticeable reconstruction errors. To address this, we propose a weighted integer shear averaging method. The approach combines reconstructions from nearby integer shears with carefully chosen weights designed to cancel the dominant error terms. Analytical error analysis shows that two-shear averaging removes first-order errors, while three-shear averaging removes second-order errors. Numerical simulations with a test wavefront confirm that the method achieves significantly lower RMS error than conventional single-shear reconstruction. The technique is simple, computationally efficient, and can be readily extended to two-dimensional interferometry. This makes weighted integer shear averaging a practical and accurate tool for wavefront reconstruction when fractional shear is unavoidable.</div></div>","PeriodicalId":49719,"journal":{"name":"Optics and Lasers in Engineering","volume":"201 ","pages":"Article 109664"},"PeriodicalIF":3.7,"publicationDate":"2026-01-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146079585","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2026-01-30DOI: 10.1016/j.optlaseng.2025.109581
Wenxu Jiang , Liyong Ren , Jian Liang
Compared to simultaneous polarimetric imaging systems, time-division systems have unique advantages, including higher detection accuracy, superior spatial resolution, and simpler structural design, making them suitable for a wide range of applications. However, conventional time-division polarimetric imaging systems that rely on rotating optical elements often suffer from reduced reliability, while those based on liquid crystal variable retarders (LCVRs) are typically constrained to single-wavelength operation. To address these limitations, we propose a broadband time-division polarimetric imaging system that eliminates the need for rotating components. A dual-path correction framework is established to compensate for phase retardation errors caused by the wavelength dependent dispersion of the LCVR in the 450-650 nm spectral range, which enables accurate broadband polarimetric imaging across the visible spectrum. Experimental results show that the proposed system achieves an angle of polarization (AoP) measurement error εAoP within 2.28% and a degree of polarization (DoP) measurement error εDoP within 2.5%. This work may provide a reliable technical pathway toward time-division polarimetric imaging with enhanced stability, high precision, low noise, and free from mechanical error sources.
{"title":"LCVR-based broadband time-division polarimetric imaging technology in visible spectral range","authors":"Wenxu Jiang , Liyong Ren , Jian Liang","doi":"10.1016/j.optlaseng.2025.109581","DOIUrl":"10.1016/j.optlaseng.2025.109581","url":null,"abstract":"<div><div>Compared to simultaneous polarimetric imaging systems, time-division systems have unique advantages, including higher detection accuracy, superior spatial resolution, and simpler structural design, making them suitable for a wide range of applications. However, conventional time-division polarimetric imaging systems that rely on rotating optical elements often suffer from reduced reliability, while those based on liquid crystal variable retarders (LCVRs) are typically constrained to single-wavelength operation. To address these limitations, we propose a broadband time-division polarimetric imaging system that eliminates the need for rotating components. A dual-path correction framework is established to compensate for phase retardation errors caused by the wavelength dependent dispersion of the LCVR in the 450-650 nm spectral range, which enables accurate broadband polarimetric imaging across the visible spectrum. Experimental results show that the proposed system achieves an angle of polarization (AoP) measurement error ε<sub>AoP</sub> within 2.28% and a degree of polarization (DoP) measurement error ε<sub>DoP</sub> within 2.5%. This work may provide a reliable technical pathway toward time-division polarimetric imaging with enhanced stability, high precision, low noise, and free from mechanical error sources.</div></div>","PeriodicalId":49719,"journal":{"name":"Optics and Lasers in Engineering","volume":"201 ","pages":"Article 109581"},"PeriodicalIF":3.7,"publicationDate":"2026-01-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146079500","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2026-01-29DOI: 10.1016/j.optlaseng.2026.109662
Yanling Li , Feng Gao , Yongjia Xu , Matthew Hill , Yubo Ni , Nan Gao , Zhaozong Meng , Zonghua Zhang , Xiangqian Jiang
Geometric optics based optical phase measuring techniques, most prominently fringe projection profilometry (FPP) and phase measuring deflectometry (PMD), have been widely researched for three-dimensional (3D) shape measurement of both diffuse and specular surfaces owing to their advantages of non-contact, speed, and accuracy. FPP is well suited for the measurement of diffuse surfaces, while PMD excels in the measurement of specular surfaces. Various system models and calibration methods for the measurement of composite surfaces have been detailed in literature; however, a comparative overview of the strengths and weaknesses of viable measurement models, calibration methods and application scenarios are lacking. In this work, a review of the advancements in composite surface measurement is presented. Firstly, the fundamental principles of different models are reviewed and categorized, with a comparative analysis of their advantages, limitations, and future development directions. Then, existing calibration techniques are systematically summarized and classified according to their logical relationships, identifying their strengths, weaknesses, and remaining challenges to guide future research. Furthermore, accuracy verification and error compensation strategies for composite surface measurement systems are comprehensively summarized, revealing current research gaps. Finally, future development trends and potential research directions in composite surface measurement and calibration are discussed to address practical challenges such as in-situ measurement in industrial manufacturing, and to provide valuable insights for subsequent studies.
{"title":"Review of system modeling and calibration technologies for specular/diffuse composite surface metrology","authors":"Yanling Li , Feng Gao , Yongjia Xu , Matthew Hill , Yubo Ni , Nan Gao , Zhaozong Meng , Zonghua Zhang , Xiangqian Jiang","doi":"10.1016/j.optlaseng.2026.109662","DOIUrl":"10.1016/j.optlaseng.2026.109662","url":null,"abstract":"<div><div>Geometric optics based optical phase measuring techniques, most prominently fringe projection profilometry (FPP) and phase measuring deflectometry (PMD), have been widely researched for three-dimensional (3D) shape measurement of both diffuse and specular surfaces owing to their advantages of non-contact, speed, and accuracy. FPP is well suited for the measurement of diffuse surfaces, while PMD excels in the measurement of specular surfaces. Various system models and calibration methods for the measurement of composite surfaces have been detailed in literature; however, a comparative overview of the strengths and weaknesses of viable measurement models, calibration methods and application scenarios are lacking. In this work, a review of the advancements in composite surface measurement is presented. Firstly, the fundamental principles of different models are reviewed and categorized, with a comparative analysis of their advantages, limitations, and future development directions. Then, existing calibration techniques are systematically summarized and classified according to their logical relationships, identifying their strengths, weaknesses, and remaining challenges to guide future research. Furthermore, accuracy verification and error compensation strategies for composite surface measurement systems are comprehensively summarized, revealing current research gaps. Finally, future development trends and potential research directions in composite surface measurement and calibration are discussed to address practical challenges such as in-situ measurement in industrial manufacturing, and to provide valuable insights for subsequent studies.</div></div>","PeriodicalId":49719,"journal":{"name":"Optics and Lasers in Engineering","volume":"201 ","pages":"Article 109662"},"PeriodicalIF":3.7,"publicationDate":"2026-01-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146079584","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2026-01-28DOI: 10.1016/j.optlaseng.2026.109627
Stefan Hager , Georg Schitter , Ernst Csencsics
This paper presents a novel approach for accurate surface reconstruction of uniformly moving rigid samples from multi-shot structured light profilometry (SLP). Conventional triangulation-based multi-shot SLP cannot handle moving objects as motion during the acquisition phase causes errors in the assignment of pixel correspondence between cameras and projector. The proposed method utilizes an optimization-based, iterative strategy that considers the movement of the sample between consecutive captures to reconstruct the surface geometry. The optimization process is designed to minimize an objective function which evaluates the pixel value similarities between reprojected surface points in both the camera and projector images. The surface is reconstructed by iteratively refining the minimum search in the objective function using image filtering methods and gradient-based solvers. The method enables robust surface reconstruction of moving samples with a high measurement accuracy of 17 µm for various directions and extents of motion, which can compete with static measurement results from conventional, high-accuracy SLP methods while outperforming them by a factor of more than 20 for large sample displacements, making multi-shot SLP accessible for industrial in-line measurement applications.
{"title":"Optimization-based structured light profilometry for surface reconstruction of moving objects","authors":"Stefan Hager , Georg Schitter , Ernst Csencsics","doi":"10.1016/j.optlaseng.2026.109627","DOIUrl":"10.1016/j.optlaseng.2026.109627","url":null,"abstract":"<div><div>This paper presents a novel approach for accurate surface reconstruction of uniformly moving rigid samples from multi-shot structured light profilometry (SLP). Conventional triangulation-based multi-shot SLP cannot handle moving objects as motion during the acquisition phase causes errors in the assignment of pixel correspondence between cameras and projector. The proposed method utilizes an optimization-based, iterative strategy that considers the movement of the sample between consecutive captures to reconstruct the surface geometry. The optimization process is designed to minimize an objective function which evaluates the pixel value similarities between reprojected surface points in both the camera and projector images. The surface is reconstructed by iteratively refining the minimum search in the objective function using image filtering methods and gradient-based solvers. The method enables robust surface reconstruction of moving samples with a high measurement accuracy of 17 µm for various directions and extents of motion, which can compete with static measurement results from conventional, high-accuracy SLP methods while outperforming them by a factor of more than 20 for large sample displacements, making multi-shot SLP accessible for industrial in-line measurement applications.</div></div>","PeriodicalId":49719,"journal":{"name":"Optics and Lasers in Engineering","volume":"201 ","pages":"Article 109627"},"PeriodicalIF":3.7,"publicationDate":"2026-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146079579","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2026-01-28DOI: 10.1016/j.optlaseng.2026.109660
Ben Xiang , Xinru Wu , Haoran Zhang , Jian Liu , Yao Yu , Jingmin Luan , Yuqian Zhao , Yi Wang , Yanqiu Yang , Zhenhe Ma
In this study, we present an optical coherence tomography angiography (OCTA) method based on Kalman filtering of optical attenuation coefficient (OAC) and eigen decomposition (oED) for clutter suppression and deep microvascular signal enhancement. The proposed approach utilizes the inherent characteristics of the tissue and suppresses the influence of noise floor on the accuracy of OAC calculation through Kalman filtering, effectively solving the problem of low deep OCT signals causing deep microvascular signals to be overwhelmed by noise and light source jitter. Concurrently, by performing eigen decomposition on the computed OAC images, the method achieves substantial clutter suppression. In phantom and in vivo experiments, oED can effectively suppress clutter and noise, extract deep microvascular signals, promote better differentiation between blood vessels and static tissues, and visualize deep microvessels. Owing to these advantages, vascular maps processed with the oED method exhibit enhanced vessel visibility and connectivity, thereby substantially improving overall image quality. This approach holds significant promise for studying vascular-related pathology in pairs.
{"title":"Clutter suppression of optical coherence tomography angiography based on kalman filtering of optical attenuation coefficient and eigen decomposition for deep cortex vascular visualization","authors":"Ben Xiang , Xinru Wu , Haoran Zhang , Jian Liu , Yao Yu , Jingmin Luan , Yuqian Zhao , Yi Wang , Yanqiu Yang , Zhenhe Ma","doi":"10.1016/j.optlaseng.2026.109660","DOIUrl":"10.1016/j.optlaseng.2026.109660","url":null,"abstract":"<div><div>In this study, we present an optical coherence tomography angiography (OCTA) method based on Kalman filtering of optical attenuation coefficient (OAC) and eigen decomposition (oED) for clutter suppression and deep microvascular signal enhancement. The proposed approach utilizes the inherent characteristics of the tissue and suppresses the influence of noise floor on the accuracy of OAC calculation through Kalman filtering, effectively solving the problem of low deep OCT signals causing deep microvascular signals to be overwhelmed by noise and light source jitter. Concurrently, by performing eigen decomposition on the computed OAC images, the method achieves substantial clutter suppression. In phantom and in vivo experiments, oED can effectively suppress clutter and noise, extract deep microvascular signals, promote better differentiation between blood vessels and static tissues, and visualize deep microvessels. Owing to these advantages, vascular maps processed with the oED method exhibit enhanced vessel visibility and connectivity, thereby substantially improving overall image quality. This approach holds significant promise for studying vascular-related pathology in pairs.</div></div>","PeriodicalId":49719,"journal":{"name":"Optics and Lasers in Engineering","volume":"201 ","pages":"Article 109660"},"PeriodicalIF":3.7,"publicationDate":"2026-01-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146079499","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2026-01-27DOI: 10.1016/j.optlaseng.2026.109641
Fan Zhang , Xiangfeng Zhang , Hong Jiang , Zhiyi Fan , Kaige Sun , Hongxia Shi , Yefeng Li
Accurate optical inspection of ceramic components is essential for ensuring the reliability of piezoelectric devices and other precision optoelectronic systems. Surface defect detection of buzzer ceramic discs, when combined with deep learning and machine vision, provides a powerful non-contact approach for high-precision quality evaluation under challenging optical conditions. To address the difficulties of extracting subtle defect features in low-contrast and complex illumination environments, an improved detection model, CerDef-Detector, was developed based on the YOLOv11n framework. In this model, a novel Dual-Directional Attention (D2A) module and a Bi-Directional Feature Interaction (BDFI) module were incorporated to effectively enhance the perception of dents and scratches. In addition, a Shape-Intersection over Union (Shape-IoU) loss function was employed to optimize bounding box regression accuracy. A comprehensive ceramic disc defect image dataset encompassing multiple defect types was constructed to support model training. Experimental results showed that CerDef-Detector achieved a precision (P) of 97.21%, a recall (R) of 96.45%, and a mean Average Precision at a 0.5 IoU threshold ([email protected]) of 97.92%, significantly outperforming mainstream detection models. Practical analyses on lighting conditions, defect categories, inference speed, and model size indicated that the proposed method can efficiently accomplish optical defect detection on buzzer ceramic surfaces. This approach offers a reliable and scalable solution for intelligent machine-vision inspection and laser-assisted quality control in advanced manufacturing and other optics-driven industrial applications.
陶瓷元件的精确光学检测对于确保压电器件和其他精密光电系统的可靠性至关重要。蜂鸣器陶瓷片的表面缺陷检测与深度学习和机器视觉相结合，为在具有挑战性的光学条件下进行高精度质量评估提供了一种强大的非接触方法。针对低对比度、复杂光照环境下细微缺陷特征提取困难的问题，基于YOLOv11n框架开发了一种改进的检测模型CerDef-Detector。在该模型中，采用了一种新型的双向注意（D2A）模块和双向特征交互（BDFI）模块，有效增强了对凹痕和划痕的感知。此外，采用Shape-Intersection over Union （Shape-IoU）损失函数优化边界盒回归精度。构建了包含多种缺陷类型的陶瓷圆盘缺陷图像数据集，以支持模型训练。实验结果表明，CerDef-Detector的准确率(P)为97.21%，召回率(R)为96.45%，在0.5 IoU阈值（[email protected]）下的平均准确率（Average precision）为97.92%，显著优于主流检测模型。对光照条件、缺陷种类、推理速度和模型尺寸的实际分析表明，该方法可以有效地完成蜂鸣器陶瓷表面的光学缺陷检测。这种方法为先进制造和其他光学驱动的工业应用中的智能机器视觉检测和激光辅助质量控制提供了可靠和可扩展的解决方案。
{"title":"CerDef-Detector: automated detection of surface defects in buzzer ceramic discs based on deep learning and machine vision","authors":"Fan Zhang , Xiangfeng Zhang , Hong Jiang , Zhiyi Fan , Kaige Sun , Hongxia Shi , Yefeng Li","doi":"10.1016/j.optlaseng.2026.109641","DOIUrl":"10.1016/j.optlaseng.2026.109641","url":null,"abstract":"<div><div>Accurate optical inspection of ceramic components is essential for ensuring the reliability of piezoelectric devices and other precision optoelectronic systems. Surface defect detection of buzzer ceramic discs, when combined with deep learning and machine vision, provides a powerful non-contact approach for high-precision quality evaluation under challenging optical conditions. To address the difficulties of extracting subtle defect features in low-contrast and complex illumination environments, an improved detection model, CerDef-Detector, was developed based on the YOLOv11n framework. In this model, a novel Dual-Directional Attention (D2A) module and a Bi-Directional Feature Interaction (BDFI) module were incorporated to effectively enhance the perception of dents and scratches. In addition, a Shape-Intersection over Union (Shape-IoU) loss function was employed to optimize bounding box regression accuracy. A comprehensive ceramic disc defect image dataset encompassing multiple defect types was constructed to support model training. Experimental results showed that CerDef-Detector achieved a precision (P) of 97.21%, a recall (R) of 96.45%, and a mean Average Precision at a 0.5 IoU threshold ([email protected]) of 97.92%, significantly outperforming mainstream detection models. Practical analyses on lighting conditions, defect categories, inference speed, and model size indicated that the proposed method can efficiently accomplish optical defect detection on buzzer ceramic surfaces. This approach offers a reliable and scalable solution for intelligent machine-vision inspection and laser-assisted quality control in advanced manufacturing and other optics-driven industrial applications.</div></div>","PeriodicalId":49719,"journal":{"name":"Optics and Lasers in Engineering","volume":"201 ","pages":"Article 109641"},"PeriodicalIF":3.7,"publicationDate":"2026-01-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146079583","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2026-01-27DOI: 10.1016/j.optlaseng.2026.109639
Wei He , Mingming Xie , Hanhan Jia , Sirui Mo , Jinluo Zou , Bo Liu , Qihong Fang , Huimin Xie , Jiaqiang Li , Xing Sun
In photomechanics, speckles and gratings serve as essential carriers or sensors for deformation measurement in methods including digital image correlation (DIC) and Moiré. Their fabrication quality directly influences the measurement accuracy, especially in extreme conditions, such as high-temperature and micro/nano-scale. At high temperatures, deformation carriers are prone to oxidation, degradation and ablation; concurrently, fabricating high quality and parametrically defined deformation carriers at miniature scales presents a significant challenge. This review describes recent progress and limitations in the fabrication of deformation carriers for extreme conditions, emphasizing high-temperature and micro/nano-scale. A classification and discussion of classical and state-of-the-art techniques is presented, evaluating them based on parametric fabrication capability, and their destructive or non-destructive characteristics. In addition, fabrication techniques for other extreme conditions including impact, underwater, and cryogenic temperature, are synthesized and analyzed. This review aims to provide a theoretical foundation and methodological reference for fabricating and optimizing deformation carriers, enabling reliable deformation measurements in extreme conditions.
{"title":"Fabrication techniques of deformation carriers in extreme conditions","authors":"Wei He , Mingming Xie , Hanhan Jia , Sirui Mo , Jinluo Zou , Bo Liu , Qihong Fang , Huimin Xie , Jiaqiang Li , Xing Sun","doi":"10.1016/j.optlaseng.2026.109639","DOIUrl":"10.1016/j.optlaseng.2026.109639","url":null,"abstract":"<div><div>In photomechanics, speckles and gratings serve as essential carriers or sensors for deformation measurement in methods including digital image correlation (DIC) and Moiré. Their fabrication quality directly influences the measurement accuracy, especially in extreme conditions, such as high-temperature and micro/nano-scale. At high temperatures, deformation carriers are prone to oxidation, degradation and ablation; concurrently, fabricating high quality and parametrically defined deformation carriers at miniature scales presents a significant challenge. This review describes recent progress and limitations in the fabrication of deformation carriers for extreme conditions, emphasizing high-temperature and micro/nano-scale. A classification and discussion of classical and state-of-the-art techniques is presented, evaluating them based on parametric fabrication capability, and their destructive or non-destructive characteristics. In addition, fabrication techniques for other extreme conditions including impact, underwater, and cryogenic temperature, are synthesized and analyzed. This review aims to provide a theoretical foundation and methodological reference for fabricating and optimizing deformation carriers, enabling reliable deformation measurements in extreme conditions.</div></div>","PeriodicalId":49719,"journal":{"name":"Optics and Lasers in Engineering","volume":"201 ","pages":"Article 109639"},"PeriodicalIF":3.7,"publicationDate":"2026-01-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146079501","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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