{"title":"Refraction techniques for continuous laser beam deflection: An overview","authors":"Marek Dobosz","doi":"10.1016/j.precisioneng.2024.10.009","DOIUrl":null,"url":null,"abstract":"<div><div>This paper presents an overview of techniques based on refraction for light laser beam deflectors, including laser scanners. A new typology is proposed based on the principle of operation, and the reader is directed to the literature related to the individual subtypes and to some arbitrarily selected representative examples. This review is limited to the continuous or quasi-continuous mode of operation. Two types of basic steering deflection techniques can be distinguished, which involve a variable angle of incidence at the refractor, and a variable refractive index. Techniques with a variable angle of incidence at the refractor can be divided into the following main subgroups: rotary wedge, Risley prism, double lens adjustable optical wedge, liquid wedges, decentered refractors, and variable curvature of the refractive interface. Two main subgroups of techniques based on variable refractive index are highlighted: those in which the refractive indices of the media that create the refracting boundary are changed, and those that use a variable gradient index for a medium. The main technical parameters (such as resolution, deflection angle, speed etc.) and useable properties are specified for each technique.</div></div>","PeriodicalId":54589,"journal":{"name":"Precision Engineering-Journal of the International Societies for Precision Engineering and Nanotechnology","volume":"91 ","pages":"Pages 522-535"},"PeriodicalIF":3.5000,"publicationDate":"2024-10-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Precision Engineering-Journal of the International Societies for Precision Engineering and Nanotechnology","FirstCategoryId":"5","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0141635924002368","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, MANUFACTURING","Score":null,"Total":0}
引用次数: 0
Abstract
This paper presents an overview of techniques based on refraction for light laser beam deflectors, including laser scanners. A new typology is proposed based on the principle of operation, and the reader is directed to the literature related to the individual subtypes and to some arbitrarily selected representative examples. This review is limited to the continuous or quasi-continuous mode of operation. Two types of basic steering deflection techniques can be distinguished, which involve a variable angle of incidence at the refractor, and a variable refractive index. Techniques with a variable angle of incidence at the refractor can be divided into the following main subgroups: rotary wedge, Risley prism, double lens adjustable optical wedge, liquid wedges, decentered refractors, and variable curvature of the refractive interface. Two main subgroups of techniques based on variable refractive index are highlighted: those in which the refractive indices of the media that create the refracting boundary are changed, and those that use a variable gradient index for a medium. The main technical parameters (such as resolution, deflection angle, speed etc.) and useable properties are specified for each technique.
期刊介绍:
Precision Engineering - Journal of the International Societies for Precision Engineering and Nanotechnology is devoted to the multidisciplinary study and practice of high accuracy engineering, metrology, and manufacturing. The journal takes an integrated approach to all subjects related to research, design, manufacture, performance validation, and application of high precision machines, instruments, and components, including fundamental and applied research and development in manufacturing processes, fabrication technology, and advanced measurement science. The scope includes precision-engineered systems and supporting metrology over the full range of length scales, from atom-based nanotechnology and advanced lithographic technology to large-scale systems, including optical and radio telescopes and macrometrology.