Fast and Accurate Data Sheet Based Analytical Switching Loss Model for a SiC MOSFET and Schottky Diode Half-Bridge

IF 5 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE open journal of power electronics Pub Date : 2024-10-24 DOI:10.1109/OJPEL.2024.3485891
Anliang Hu;Jürgen Biela
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Abstract

Fast and accurate switching loss models that can be used for different devices are crucial for optimization-based converter design. This paper proposes a novel data sheet based, fully analytical loss model for a SiC MOSFET and Schottky diode half-bridge including parasitics. In the model, nonlinear device characteristics are approximated by multi-step piecewise constants. Furthermore, a small number of assumptions are used to derive and to solve the approximated nonlinear differential equations for obtaining the switching losses. To evaluate the model, a new accuracy measure is proposed for a fair accuracy comparison with existing models. The proposed model is also comprehensively verified by double pulse tests using 5 SiC MOSFET (with different structures) and Schottky diode pairs from different manufacturers. The proposed fully analytical model exhibits on average the best accuracy with a high computational efficiency (less than 1 ms per operating point) compared to state-of-the-art analytical switching loss models, as validated by using both data sheet information and measured device characteristics.
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基于数据表的碳化硅 MOSFET 和肖特基二极管半桥快速精确开关损耗分析模型
可用于不同器件的快速准确开关损耗模型对于基于优化的转换器设计至关重要。本文针对 SiC MOSFET 和肖特基二极管半桥(包括寄生效应)提出了一种基于数据表的新型全分析损耗模型。在该模型中,非线性器件特性由多级片式常数近似表示。此外,还使用了少量假设来推导和求解近似非线性微分方程,以获得开关损耗。为了评估该模型,提出了一种新的精度测量方法,以便与现有模型进行公平的精度比较。此外,还通过使用 5 个不同制造商生产的 SiC MOSFET(具有不同结构)和肖特基二极管对进行双脉冲测试,对所提出的模型进行了全面验证。与最先进的分析开关损耗模型相比,所提出的全分析模型平均精度最高,计算效率高(每个工作点小于 1 毫秒),数据表信息和测量的器件特性均验证了这一点。
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CiteScore
8.60
自引率
0.00%
发文量
0
审稿时长
8 weeks
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