Ultra-fast light-field microscopy with event detection

IF 20.6 Q1 OPTICS Light-Science & Applications Pub Date : 2024-11-07 DOI:10.1038/s41377-024-01603-1
Liheng Bian, Xuyang Chang, Hanwen Xu, Jun Zhang
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Abstract

The event detection technique has been introduced to light-field microscopy, boosting its imaging speed in orders of magnitude with simultaneous axial resolution enhancement in scattering medium.

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带事件检测功能的超快光场显微镜
光场显微镜引入了事件检测技术,使其成像速度提高了几个数量级,同时提高了散射介质的轴向分辨率。
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来源期刊
Light-Science & Applications
Light-Science & Applications 数理科学, 物理学I, 光学, 凝聚态物性 II :电子结构、电学、磁学和光学性质, 无机非金属材料, 无机非金属类光电信息与功能材料, 工程与材料, 信息科学, 光学和光电子学, 光学和光电子材料, 非线性光学与量子光学
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803
审稿时长
2.1 months
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