Hang Liao, Zheyang Zheng, Li Zhang, Tao Chen, Yan Cheng, Kevin J. Chen
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引用次数: 0
Abstract
A 600-V p-GaN gate double channel HEMT (DC-HEMT) is presented with a systematic investigation of the gate characteristics, including the leakage current, breakdown, and reliability under forward bias stress. It is found that the gate leakage of the DC-HEMT is substantially lower than that of the p-GaN single channel HEMT (SC-HEMT) owing to suppressed electron spillover that stems from hole storage in the quantum well upper channel. Consequently, the gate breakdown voltage of the DC-HEMT is improved to 14.7 V compared to 12.2 V of the SC-HEMT. Besides, the gate operating voltage margin of the DC-HEMT is expanded to 4.2 V compared to 3.3 V of the SC-HEMT according to the gate lifetime evaluation.
期刊介绍：
Applied Physics Letters (APL) features concise, up-to-date reports on significant new findings in applied physics. Emphasizing rapid dissemination of key data and new physical insights, APL offers prompt publication of new experimental and theoretical papers reporting applications of physics phenomena to all branches of science, engineering, and modern technology.
In addition to regular articles, the journal also publishes invited Fast Track, Perspectives, and in-depth Editorials which report on cutting-edge areas in applied physics.
APL Perspectives are forward-looking invited letters which highlight recent developments or discoveries. Emphasis is placed on very recent developments, potentially disruptive technologies, open questions and possible solutions. They also include a mini-roadmap detailing where the community should direct efforts in order for the phenomena to be viable for application and the challenges associated with meeting that performance threshold. Perspectives are characterized by personal viewpoints and opinions of recognized experts in the field.
Fast Track articles are invited original research articles that report results that are particularly novel and important or provide a significant advancement in an emerging field. Because of the urgency and scientific importance of the work, the peer review process is accelerated. If, during the review process, it becomes apparent that the paper does not meet the Fast Track criterion, it is returned to a normal track.
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