{"title":"A Dataflow-Aware Network-on-Interposer for CNN Inferencing in the Presence of Defective Chiplets","authors":"Harsh Sharma;Umit Ogras;Ananth Kalyanraman;Partha Pratim Pande","doi":"10.1109/TCAD.2024.3447210","DOIUrl":null,"url":null,"abstract":"The emergence of 2.5D chiplet platforms provides a new avenue for compact scale-out implementations of deep learning (DL) workloads (WLs). Integrating multiple small chiplets using a network-on-interposer (NoI) offers not only significant cost reduction and higher manufacturing yield than 2-D ICs but also better energy efficiency and performance. However, defects in chiplets may compromise performance since they restrict the computing capability. Therefore, carefully designed chiplet and NoI link placement, and task mapping schemes, in presence of defects, are necessary. In this article, we propose a defect-aware NoI design approach using a custom-defined space-filling curve (SFC) for efficient execution of mixed WLs of convolutional neural network (CNN) inference tasks. We demonstrate that the k-ary n-cube-based NoI topologies can be degenerated into SFC-based counterparts, which we refer to as SFCed NoI topologies. They enable high performance and energy efficiency with lower fabrication costs over their parent k-ary n-cube counterparts. The SFCed approach helps us to extract high performance from an inherently defective system. We demonstrate that SFCed design achieves up to \n<inline-formula> <tex-math>$2.3\\times $ </tex-math></inline-formula>\n and \n<inline-formula> <tex-math>$3.5\\times $ </tex-math></inline-formula>\n reduction in latency and energy, respectively, compared to parent NoI architectures while executing diverse DL WLs.","PeriodicalId":13251,"journal":{"name":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","volume":"43 11","pages":"4190-4201"},"PeriodicalIF":2.7000,"publicationDate":"2024-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10745841","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10745841/","RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"COMPUTER SCIENCE, HARDWARE & ARCHITECTURE","Score":null,"Total":0}
引用次数: 0
Abstract
The emergence of 2.5D chiplet platforms provides a new avenue for compact scale-out implementations of deep learning (DL) workloads (WLs). Integrating multiple small chiplets using a network-on-interposer (NoI) offers not only significant cost reduction and higher manufacturing yield than 2-D ICs but also better energy efficiency and performance. However, defects in chiplets may compromise performance since they restrict the computing capability. Therefore, carefully designed chiplet and NoI link placement, and task mapping schemes, in presence of defects, are necessary. In this article, we propose a defect-aware NoI design approach using a custom-defined space-filling curve (SFC) for efficient execution of mixed WLs of convolutional neural network (CNN) inference tasks. We demonstrate that the k-ary n-cube-based NoI topologies can be degenerated into SFC-based counterparts, which we refer to as SFCed NoI topologies. They enable high performance and energy efficiency with lower fabrication costs over their parent k-ary n-cube counterparts. The SFCed approach helps us to extract high performance from an inherently defective system. We demonstrate that SFCed design achieves up to
$2.3\times $
and
$3.5\times $
reduction in latency and energy, respectively, compared to parent NoI architectures while executing diverse DL WLs.
2.5D 芯片平台的出现为深度学习(DL)工作负载(WL)的紧凑型扩展实施提供了一条新途径。与二维集成电路相比,利用网络集成器(NoI)集成多个小型芯片不仅能显著降低成本、提高制造良率,还能提高能效和性能。然而,芯片中的缺陷可能会影响性能,因为它们限制了计算能力。因此,在存在缺陷的情况下,有必要精心设计芯片和 NoI 链路布局以及任务映射方案。在本文中,我们提出了一种缺陷感知 NoI 设计方法,使用自定义空间填充曲线(SFC)高效执行卷积神经网络(CNN)推理任务的混合 WL。我们证明,基于 k-ary n 立方体的 NoI 拓扑可以退化为基于 SFC 的对应拓扑,我们称之为 SFCed NoI 拓扑。与kary n立方体拓扑相比,SFCed NoI拓扑能以更低的制造成本实现更高的性能和能效。SFCed 方法有助于我们从固有缺陷的系统中提取高性能。我们证明,与父 NoI 架构相比,SFCed 设计在执行多样化的 DL WL 时,延迟和能耗分别降低了 2.3 倍和 3.5 倍。
期刊介绍:
The purpose of this Transactions is to publish papers of interest to individuals in the area of computer-aided design of integrated circuits and systems composed of analog, digital, mixed-signal, optical, or microwave components. The aids include methods, models, algorithms, and man-machine interfaces for system-level, physical and logical design including: planning, synthesis, partitioning, modeling, simulation, layout, verification, testing, hardware-software co-design and documentation of integrated circuit and system designs of all complexities. Design tools and techniques for evaluating and designing integrated circuits and systems for metrics such as performance, power, reliability, testability, and security are a focus.