Proposal of an alternative method for residual stress measurements in clad nickel alloy after shot peening

IF 5.2 2区 工程技术 Q1 ENGINEERING, MULTIDISCIPLINARY Measurement Pub Date : 2024-11-14 DOI:10.1016/j.measurement.2024.116230
Vladimir Ivanovitch Monine , João da Cruz Payão Filho , Mara Cardoso Gonçalves Rios Alonso Munhoz , Joaquim Teixeira de Assis
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Abstract

Cladding of Ni-based superalloy 625 is often used to enhance mechanical resistance and corrosion performance of the high strength low alloy pipeline, for use in CO2 injection units in oil wells. It is well known that the use of the shot peening can improve its properties by creating a thin surface layer with compressive residual stresses. In this regard, the aim of this work is to propose an alternative method to evaluate the residual stresses of clad Ni-based superalloy 625 based on the deflection measurements of a thin strip separated from the shot peened samples by EDM cutting. The stress distribution in shot peened layer was measured by XRD sin2ψ method with electrolytic removal of surface layers. Measurements by the alternative and XRD method showed that the difference between the average stress values determined by these methods is 4%.
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关于喷丸强化后测量堆焊镍合金残余应力的替代方法的建议
镍基超合金 625 的覆层通常用于提高高强度低合金管道的机械阻力和腐蚀性能,以用于油井中的二氧化碳注入装置。众所周知,使用喷丸强化可以通过产生具有压缩残余应力的薄表面层来改善其性能。因此,这项工作的目的是提出一种替代方法,通过电火花切割从喷丸强化样品中分离出来的薄带的挠度测量来评估包覆镍基超合金 625 的残余应力。在电解去除表面层的情况下,采用 XRD sin2ψ 方法测量了喷丸强化层中的应力分布。替代方法和 XRD 方法的测量结果表明,这两种方法测定的平均应力值相差 4%。
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来源期刊
Measurement
Measurement 工程技术-工程:综合
CiteScore
10.20
自引率
12.50%
发文量
1589
审稿时长
12.1 months
期刊介绍: Contributions are invited on novel achievements in all fields of measurement and instrumentation science and technology. Authors are encouraged to submit novel material, whose ultimate goal is an advancement in the state of the art of: measurement and metrology fundamentals, sensors, measurement instruments, measurement and estimation techniques, measurement data processing and fusion algorithms, evaluation procedures and methodologies for plants and industrial processes, performance analysis of systems, processes and algorithms, mathematical models for measurement-oriented purposes, distributed measurement systems in a connected world.
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