Comprehensive analysis of beryllium content influence on secondary electron yield in CuBe alloys

Abstract

This study examines the impact of varying Be contents on the evolution of secondary electron emission (SEE) properties. Through microscopic characterization of the microstructure before and after activation, it was determined that the phase composition was α(Cu) phase and eutectic structure (α(Cu) + γ). The findings indicate that as the Be content increased from 2.8 wt.% to 3.8 wt.%, the proportion of heterogeneous structures increased and the distribution became more uniform. Meanwhile, the number of heterogeneous structure interfaces between α(Cu) phase and γ phase increased, and there were a large number of mismatch dislocations at the interfaces, which served as short-circuit diffusion paths for Be elements. Be elements were more easily able to diffuse outward through the interface to form a uniform BeO film, thereby increasing secondary electron yield (SEY). In addition, the density of mismatch dislocations near the interface was high, promoting the formation of grain boundaries, which provided more diffusion pathways, allowing Be elements to diffuse outward more easily, thereby generating a uniform BeO film with increased SEY. This study holds significant implications for augmenting the SEY of CuBe dynode electrodes used in photomultiplier tubes (PMTs).