Investigation of Impurities Distribution on the mc-Si Ingot Grown by the Silicon Nitride Coated Carbon Crucible: Numerical Simulation

Abstract

The multi-crystalline silicon (mc-Si) ingot quality is mainly influenced by the generation of impurities and their diffusion. A transient global simulation helps to study the impurities distribution in the grown mc-Si ingot. In this work, crucible materials such as quartz and carbon are used to grow mc-Si ingots, and the impurities distribution of both silicon ingots are analyzed. Non-metallic impurities such as oxygen, and carbon are the major impurities formed in the silicon crystal during the directional solidification (DS) process. These impurities arise from the parts of the furnace and are segregated partly into the mc-Si ingot. The impurities such as oxygen and carbon were analyzed at the melt-crystal interface as well as in grown mc-Si ingots. Further, the gaseous impurities such as silicon monoxide and carbon monoxide are analyzed in the melt-free surface. The solar cell performance mainly depends on the quality of the silicon ingot. The mc-Si ingot grown by silicon nitride-coated carbon crucible gives better quality for photovoltaic industries.