{"title":"A Lightweight Reprogramming Framework for Cross-Device Fault Diagnosis in Edge Computing","authors":"Yanzhi Wang;Jinhong Wu;Shuyang Luo;Ziyang Yu;Qi Zhou","doi":"10.1109/TIM.2024.3497154","DOIUrl":null,"url":null,"abstract":"Fault diagnosis in mechanical equipment is essential for industrial system stability and safety. However, when applying the model to different models of devices, the difference in sample feature distribution seriously affects the diagnosis effect. At the same time, traditional cloud-based deployment faces delays and resource constraints, making it unable to meet real-time requirements. This article introduces a lightweight reprogramming framework for cross-device fault diagnosis in edge computing environments. It mainly includes cloud-based C-model training and edge-based E-model reprogramming and application stages. The model introduces a lightweight feature extraction (LFE) module and a decoupled fully connected (DFC) attention mechanism to enhance feature representation and global information capture. Through lightweight reprogramming, the E-model fits the device data in actual engineering while maintaining the diagnostic capability of the C-model. We used the NVIDIA Jetson Xavier NX kit as an edge computing platform and conducted verification experiments. The results show that the proposed method achieves good diagnostic effects on engineering equipment. At the same time, it achieves excellent lightweight indicators.","PeriodicalId":13341,"journal":{"name":"IEEE Transactions on Instrumentation and Measurement","volume":"74 ","pages":"1-12"},"PeriodicalIF":5.6000,"publicationDate":"2024-11-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Instrumentation and Measurement","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10752660/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Fault diagnosis in mechanical equipment is essential for industrial system stability and safety. However, when applying the model to different models of devices, the difference in sample feature distribution seriously affects the diagnosis effect. At the same time, traditional cloud-based deployment faces delays and resource constraints, making it unable to meet real-time requirements. This article introduces a lightweight reprogramming framework for cross-device fault diagnosis in edge computing environments. It mainly includes cloud-based C-model training and edge-based E-model reprogramming and application stages. The model introduces a lightweight feature extraction (LFE) module and a decoupled fully connected (DFC) attention mechanism to enhance feature representation and global information capture. Through lightweight reprogramming, the E-model fits the device data in actual engineering while maintaining the diagnostic capability of the C-model. We used the NVIDIA Jetson Xavier NX kit as an edge computing platform and conducted verification experiments. The results show that the proposed method achieves good diagnostic effects on engineering equipment. At the same time, it achieves excellent lightweight indicators.
机械设备的故障诊断对工业系统的稳定性和安全性至关重要。然而,将模型应用于不同型号的设备时,样本特征分布的差异会严重影响诊断效果。同时,传统的云端部署面临延迟和资源限制,无法满足实时性要求。本文介绍了一种用于边缘计算环境下跨设备故障诊断的轻量级重编程框架。它主要包括基于云的 C 模型训练和基于边缘的 E 模型重新编程和应用阶段。该模型引入了轻量级特征提取(LFE)模块和去耦合全连接(DFC)关注机制,以增强特征表示和全局信息捕获。通过轻量级重新编程,E-模型符合实际工程中的设备数据,同时保持了C-模型的诊断能力。我们使用英伟达 Jetson Xavier NX 套件作为边缘计算平台,并进行了验证实验。结果表明,所提出的方法对工程设备达到了良好的诊断效果。同时,它还实现了出色的轻量级指标。
期刊介绍:
Papers are sought that address innovative solutions to the development and use of electrical and electronic instruments and equipment to measure, monitor and/or record physical phenomena for the purpose of advancing measurement science, methods, functionality and applications. The scope of these papers may encompass: (1) theory, methodology, and practice of measurement; (2) design, development and evaluation of instrumentation and measurement systems and components used in generating, acquiring, conditioning and processing signals; (3) analysis, representation, display, and preservation of the information obtained from a set of measurements; and (4) scientific and technical support to establishment and maintenance of technical standards in the field of Instrumentation and Measurement.