Phase-shifting profilometry for 3D shape measurement of moving objects on production lines

Qing He, Jiaxing Ning, Xu Liu, Qingying Li
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Abstract

It is challenging for phase-shifting profilometry to measure objects in motion on production lines due to two main issues. Firstly, the movement of the object causes a mismatch in its position across different fringe patterns. Additionally, there is a violation of the ideal phase shift between these fringe patterns. To address these problems, we propose a method that takes advantage of the known moving direction of objects on production lines. By aligning the isophase direction of fringe patterns with the known direction of the moving objects, our method essentially solves the well-known phase error problem caused by object motion. Furthermore, we have developed a projection and imaging technique to track the measured object that is covered with different fringe patterns. Both of the previously listed issues have been resolved in this manner. The proposed method is validated by comparisons with state-of-the-art methods, proving its simplicity, broader applicability, and improved measurement accuracy.
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相移轮廓术用于生产线上移动物体的三维形状测量
由于两个主要问题,相移轮廓测量法在生产线上测量运动物体是具有挑战性的。首先,物体的运动导致其在不同条纹图案上的位置不匹配。此外,在这些条纹图案之间有一个理想相移的违反。为了解决这些问题,我们提出了一种利用生产线上已知物体移动方向的方法。该方法通过将条纹图的等相位方向与已知运动物体的方向对齐,从根本上解决了众所周知的由物体运动引起的相位误差问题。此外,我们还开发了一种投影和成像技术来跟踪被测量的物体,这些物体被不同的条纹图案覆盖。前面列出的两个问题都以这种方式得到了解决。通过与现有方法的比较,验证了该方法的简单性、适用性和测量精度。
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来源期刊
CiteScore
7.40
自引率
5.60%
发文量
177
审稿时长
46 days
期刊介绍: Precision Engineering - Journal of the International Societies for Precision Engineering and Nanotechnology is devoted to the multidisciplinary study and practice of high accuracy engineering, metrology, and manufacturing. The journal takes an integrated approach to all subjects related to research, design, manufacture, performance validation, and application of high precision machines, instruments, and components, including fundamental and applied research and development in manufacturing processes, fabrication technology, and advanced measurement science. The scope includes precision-engineered systems and supporting metrology over the full range of length scales, from atom-based nanotechnology and advanced lithographic technology to large-scale systems, including optical and radio telescopes and macrometrology.
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