Seed layer formation by deposition of microcrystallites on a revolving substrate: modeling of the effective linear elastic, piezoelectric, and dielectric coefficients.

Abstract

Averaging of material coefficients of crystallites deposited at an angle to a rotating substrate is considered. A simple model is proposed, and applied to determine effective linear dielectric, piezoelectric, and elastic constants of all Laue groups. While these represent tensors of rank 2, 3, and 4, the method applies generally to tensors of any rank. Results are then particularized for 6mm point symmetry crystals, and applied numerically to zinc oxide, ZnO. It is shown that, by means of the rotating substrate method, depositions may be achieved having the equivalent of hexagonal anisotropy, enabling the creation of `engineered' structures.