State-of-the-art electron beams for compact tools of ultrafast science.

IF 2.1 3区 工程技术 Q2 MICROSCOPY Ultramicroscopy Pub Date : 2025-01-01 Epub Date: 2024-11-26 DOI:10.1016/j.ultramic.2024.114080
Peter Salén, Anatoliy Opanasenko, Giovanni Perosa, Vitaliy Goryashko
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引用次数: 0

Abstract

We review state-of-the-art electron beams for single-shot megaelectronvolt ultrafast electron diffraction (MeV-UED) and compact light sources. Our primary focus is on sub-100 femtosecond electron bunches in the 2-30 MeV energy range. We demonstrate that our new and recent simulation results permit significantly improved bunch parameters for these applications.

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来源期刊
Ultramicroscopy
Ultramicroscopy 工程技术-显微镜技术
CiteScore
4.60
自引率
13.60%
发文量
117
审稿时长
5.3 months
期刊介绍: Ultramicroscopy is an established journal that provides a forum for the publication of original research papers, invited reviews and rapid communications. The scope of Ultramicroscopy is to describe advances in instrumentation, methods and theory related to all modes of microscopical imaging, diffraction and spectroscopy in the life and physical sciences.
期刊最新文献
State-of-the-art electron beams for compact tools of ultrafast science. Workflow automation of SEM acquisitions and feature tracking. Enhancing subsurface imaging in ultrasonic atomic force microscopy with optimized contact force. Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimization. Relativistic EELS scattering cross-sections for microanalysis based on Dirac solutions.
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