On Bidirectional Transition Between Threshold and Bipolar Switching in Ag/SiO$_{2}$/ITO Memristors

IF 2.1 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Transactions on Nanotechnology Pub Date : 2024-11-08 DOI:10.1109/TNANO.2024.3494856
Zidu Li;Moin Diwan;Phil David Börner;Andreas Bablich;Heidemarie Schmidt;Peter Haring Bolívar;Bhaskar Choubey
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Abstract

An Ag/SiO $_{2}$ /ITO thin-film memristor with a simple deposition technique that exhibits bidirectional threshold and bipolar memristive switching is presented. By applying adequate compliance currents, the switching mechanism of the memristor can be transitioned from threshold switching to bipolar switching. The reverse transition, from bipolar to threshold can be realized by applying a large negative current. This bidirectional switching is stable and reproducible, which has been proven by multiple experimental results. In addition, Verilog-A based modeling approach of this directional switching mechanism is also presented.
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Ag/SiO /ITO记忆电阻器阈值与双极开关双向转换研究
提出了一种具有双向阈值和双极忆阻开关的Ag/SiO /ITO薄膜忆阻器。通过施加足够的顺应电流,忆阻器的开关机制可以从阈值开关过渡到双极开关。从双极到阈值的反向转换可以通过施加大的负电流来实现。这种双向开关具有稳定性和可重复性,已被多个实验结果所证明。此外,还提出了基于Verilog-A的定向开关机制建模方法。
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来源期刊
IEEE Transactions on Nanotechnology
IEEE Transactions on Nanotechnology 工程技术-材料科学:综合
CiteScore
4.80
自引率
8.30%
发文量
74
审稿时长
8.3 months
期刊介绍: The IEEE Transactions on Nanotechnology is devoted to the publication of manuscripts of archival value in the general area of nanotechnology, which is rapidly emerging as one of the fastest growing and most promising new technological developments for the next generation and beyond.
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