Dark Current Performance Enhancement in Type-II Superlattice Photodetectors via pBn Barrier Engineering

IF 2.9 2区 工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Transactions on Electron Devices Pub Date : 2024-11-13 DOI:10.1109/TED.2024.3488683
Pooja Kawde;Anuja Singh;Bhaskaran Muralidharan
{"title":"Dark Current Performance Enhancement in Type-II Superlattice Photodetectors via pBn Barrier Engineering","authors":"Pooja Kawde;Anuja Singh;Bhaskaran Muralidharan","doi":"10.1109/TED.2024.3488683","DOIUrl":null,"url":null,"abstract":"Type-II superlattices (T2SLs) are currently technologically favored absorbers for infrared (IR) photodetectors due to their tunable band gap, lower Auger recombination rates, and higher effective masses in comparison to traditional bulk ternary alloys such as HgCdTe. The pBn barrier configuration is usually preferred to improve the dark current characteristics of the InAs/GaSb T2SL IR photodetectors. To investigate conclusively the impact of a barrier on the dark current, we present a comprehensive study featuring a pBn and a p-i-n device configuration at 77 K. In the pBn configuration, the doping levels in the barrier and absorber layer suppress the band-to-band tunneling (BTBT) and the trap-assisted tunneling (TAT) current dominates. In the p-i-n detector, the TAT current prevails with a small contribution of BTBT current near \n<inline-formula> <tex-math>${V}=-1~\\text {V}$ </tex-math></inline-formula>\n, as a function of absorber doping. It is shown that the pBn detector exhibits 104 times less TAT current when compared with the p-i-n detector at \n<inline-formula> <tex-math>${V}=-{0.1}~\\text {V}$ </tex-math></inline-formula>\n. As the dark current varies with the number of monolayers of InAs and GaSb in a given period, we then focus on the dark current minimization of three pBn detectors with an absorber layer consisting of a symmetric superlattice (SL), InAs-rich SL, and GaSb-rich SL each with an energy band gap of 0.23 eV. We conclusively ascertain and demonstrate the barrier and absorber configurations along with the bias conditions that minimize the dark currents thereby setting a stage to systematically engineer barriers with the aim of minimizing dark currents via a component-by-component analysis.","PeriodicalId":13092,"journal":{"name":"IEEE Transactions on Electron Devices","volume":"71 12","pages":"7628-7636"},"PeriodicalIF":2.9000,"publicationDate":"2024-11-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Electron Devices","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/10752924/","RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

Abstract

Type-II superlattices (T2SLs) are currently technologically favored absorbers for infrared (IR) photodetectors due to their tunable band gap, lower Auger recombination rates, and higher effective masses in comparison to traditional bulk ternary alloys such as HgCdTe. The pBn barrier configuration is usually preferred to improve the dark current characteristics of the InAs/GaSb T2SL IR photodetectors. To investigate conclusively the impact of a barrier on the dark current, we present a comprehensive study featuring a pBn and a p-i-n device configuration at 77 K. In the pBn configuration, the doping levels in the barrier and absorber layer suppress the band-to-band tunneling (BTBT) and the trap-assisted tunneling (TAT) current dominates. In the p-i-n detector, the TAT current prevails with a small contribution of BTBT current near ${V}=-1~\text {V}$ , as a function of absorber doping. It is shown that the pBn detector exhibits 104 times less TAT current when compared with the p-i-n detector at ${V}=-{0.1}~\text {V}$ . As the dark current varies with the number of monolayers of InAs and GaSb in a given period, we then focus on the dark current minimization of three pBn detectors with an absorber layer consisting of a symmetric superlattice (SL), InAs-rich SL, and GaSb-rich SL each with an energy band gap of 0.23 eV. We conclusively ascertain and demonstrate the barrier and absorber configurations along with the bias conditions that minimize the dark currents thereby setting a stage to systematically engineer barriers with the aim of minimizing dark currents via a component-by-component analysis.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
利用pBn势垒工程增强ii型超晶格光电探测器的暗电流性能
ii型超晶格(T2SLs)由于其可调谐的带隙、较低的俄歇复合率以及与传统的大块三元合金(如HgCdTe)相比更高的有效质量,目前在技术上是红外(IR)光电探测器的首选吸收材料。pBn势垒结构通常用于改善InAs/GaSb T2SL红外探测器的暗电流特性。为了最终研究势垒对暗电流的影响,我们提出了一项综合研究,其中包括pBn和p-i-n器件在77 K下的配置。在pBn结构中,势垒层和吸收层的掺杂水平抑制了带到带隧穿(BTBT),陷阱辅助隧穿(TAT)电流占主导地位。在p-i-n探测器中,作为吸收体掺杂的函数,在${V}=-1~\text {V}$附近,TAT电流占主导地位,BTBT电流的贡献很小。结果表明,在${V}=-{0.1}~\text {V}$时,pBn探测器的TAT电流比p-i-n探测器的TAT电流小104倍。在给定时间内,由于暗电流随InAs和GaSb单层数的变化而变化,因此我们重点研究了三种吸收层的pBn探测器的暗电流最小化,吸收层由对称超晶格(SL),富InAs SL和富GaSb SL组成,每个能带隙为0.23 eV。我们最终确定并演示了屏障和吸收器的配置以及最小化暗电流的偏置条件,从而为系统地设计屏障奠定了基础,目的是通过逐个组件的分析来最小化暗电流。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
IEEE Transactions on Electron Devices
IEEE Transactions on Electron Devices 工程技术-工程:电子与电气
CiteScore
5.80
自引率
16.10%
发文量
937
审稿时长
3.8 months
期刊介绍: IEEE Transactions on Electron Devices publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors. Tutorial and review papers on these subjects are also published and occasional special issues appear to present a collection of papers which treat particular areas in more depth and breadth.
期刊最新文献
Table of Contents IEEE ELECTRON DEVICES SOCIETY IEEE Transactions on Electron Devices Information for Authors Advanced Bragg Resonator Integration for Enhanced Bandwidth and Stability in G-Band TWT With Staggered Double Vane Structure In-Circuit Inductance Measurement to Correct the Single-Pulse Avalanche Energy (Eas) of Transistor Under the Unclamped Inductive-Switching (UIS) Test
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1