Xiao-Pei Zhou;Da-Wei Wang;Wen-Sheng Zhao;Peng Zhang;Jia-Hao Pan
{"title":"Modeling of Through-Silicon Capacitor and Its Applications for the Optimization of Power Distribution Network in 3-D Integrated Circuits","authors":"Xiao-Pei Zhou;Da-Wei Wang;Wen-Sheng Zhao;Peng Zhang;Jia-Hao Pan","doi":"10.1109/TSIPI.2024.3505141","DOIUrl":null,"url":null,"abstract":"In this article, the application of through-silicon capacitor (TSC) in the power distribution network (PDN) of three-dimensional (3-D) integrated circuits (ICs) is systematically investigated for the first time. Additionally, the deep reinforcement learning (DRL) algorithm is integrated to minimize the deployment of TSCs while achieving the target impedance, thereby reducing the cost in practical applications. By selectively replacing the specified through-silicon vias (TSV) with TSCs in the existing TSV array, this method not only ensures uniform stress distribution within the structure but also effectively reduces the required area for decoupling capacitors and enables greater flexibility in TSC applications. A comprehensive investigation is carried out to assess the electrical characteristics of TSCs and their efficiency in mitigating PDN impedance. Then, an advanced approach, combining vector fitting and neural networks, is employed for the parametric modeling of TSCs. The impedance of PDN in 3-D IC is computed using transmission matrix method. By incorporating 3-D IC PDN and TSC information as inputs, the DRL algorithm determines the optimal placement and types of TSCs. The impedance suppression effect of TSC in 3-D IC PDN is verified through various test cases, and the optimization results of DRL were compared with those of other intelligent algorithms. Finally, a comparative analysis was carried out, highlighting the significance of this article.","PeriodicalId":100646,"journal":{"name":"IEEE Transactions on Signal and Power Integrity","volume":"3 ","pages":"199-211"},"PeriodicalIF":0.0000,"publicationDate":"2024-11-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Signal and Power Integrity","FirstCategoryId":"1085","ListUrlMain":"https://ieeexplore.ieee.org/document/10771716/","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In this article, the application of through-silicon capacitor (TSC) in the power distribution network (PDN) of three-dimensional (3-D) integrated circuits (ICs) is systematically investigated for the first time. Additionally, the deep reinforcement learning (DRL) algorithm is integrated to minimize the deployment of TSCs while achieving the target impedance, thereby reducing the cost in practical applications. By selectively replacing the specified through-silicon vias (TSV) with TSCs in the existing TSV array, this method not only ensures uniform stress distribution within the structure but also effectively reduces the required area for decoupling capacitors and enables greater flexibility in TSC applications. A comprehensive investigation is carried out to assess the electrical characteristics of TSCs and their efficiency in mitigating PDN impedance. Then, an advanced approach, combining vector fitting and neural networks, is employed for the parametric modeling of TSCs. The impedance of PDN in 3-D IC is computed using transmission matrix method. By incorporating 3-D IC PDN and TSC information as inputs, the DRL algorithm determines the optimal placement and types of TSCs. The impedance suppression effect of TSC in 3-D IC PDN is verified through various test cases, and the optimization results of DRL were compared with those of other intelligent algorithms. Finally, a comparative analysis was carried out, highlighting the significance of this article.
本文首次系统地研究了通硅电容(TSC)在三维集成电路配电网(PDN)中的应用。此外,集成了深度强化学习(DRL)算法,在实现目标阻抗的同时最大限度地减少了tsc的部署,从而降低了实际应用中的成本。该方法通过选择性地将现有TSV阵列中指定的通硅通孔(TSV)替换为TSC,不仅保证了结构内应力分布均匀,而且有效地减少了去耦电容器所需的面积,使TSC应用具有更大的灵活性。进行了全面的调查,以评估tsc的电特性及其在减轻PDN阻抗方面的效率。然后,采用向量拟合和神经网络相结合的先进方法对tsc进行参数化建模。采用传输矩阵法计算了三维集成电路中PDN的阻抗。DRL算法通过将3-D IC PDN和TSC信息作为输入,确定TSC的最佳位置和类型。通过各种测试用例验证了TSC在三维IC PDN中的阻抗抑制效果,并将DRL的优化结果与其他智能算法的优化结果进行了比较。最后进行了对比分析,凸显了本文的意义。