Kinetic Study of the Crystallization of Free and Contact Surfaces of Fe77Ni1Si9B13 Amorphous-Alloy Ribbons under Low-Temperature Annealing

M. S. Konovalov, V. I. Lad’yanov, M. I. Mokrushina, A. A. Suslov, A. I. Shilyaev, S. A. Tereshkina, V. B. Ivanov
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Abstract

This study examines the differences in the crystallization kinetics of the free and contact sides of an Fe77Ni1Si9B13 amorphous-alloy ribbon at 400°C. X-ray phase analysis reveals that crystals based on α-Fe form on the contact side after just 5 min of annealing. In contrast, on the free side, reflections corresponding to α-Fe crystals are only detectable after 30 min of annealing. The relative content of the crystalline phase is determined using X-ray diffraction data, based on the relationship between the integral intensity of the reflection of the analyzed phase and its volume fraction. We explore the possible reasons for the observed differences in crystallization. Crystallization in the surface layers of both the contact and free sides of the ribbon occurs in two stages: the isotropic growth of existing nuclei with a decreasing rate of crystal formation, followed by the slowed anisotropic growth of already formed crystals. The first stage is satisfactorily described by the Johnson–Mehl–Avrami–Kolmogorov (JMAK) thermodynamic formalism, whereas applying a kinetic equation to describe the second stage is not appropriate.

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低温退火条件下 Fe77Ni1Si9B13 非晶合金带自由表面和接触表面结晶的动力学研究
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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