{"title":"Estimation of the Coherently Scattering Domain Size in Alloys from Neutron Diffraction Data","authors":"B. Yerzhanov, I. A. Bobrikov, A. M. Balagurov","doi":"10.1134/S1027451024700770","DOIUrl":null,"url":null,"abstract":"<p>To determine the size distribution of structurally ordered clusters dispersed within a structurally disordered alloy matrix, we analyze the diffraction patterns of the Fe<sub>74</sub>Al<sub>26</sub> alloy obtained using a high-resolution neutron diffractometer. This analysis employs the generalized Scherrer method, which involves analyzing diffraction-peak profiles, determining peak widths at heights of 1/5 and 4/5 of the maximum, and assuming a gamma distribution for cluster sizes (Pielaszek method). We compare the results obtained using the Scherrer, Williamson–Hall, and Pielaszek methods, finding them to agree. We propose an algorithm to calculate the log-normal distribution function of cluster/particle sizes. Experimental data are obtained using a time-of-flight neutron diffractometer. The analysis is conducted for two scanning variable options: in the crystallographic (direct) (<i>d</i> scale) and reciprocal (<i>H</i> scale) spaces, and possible systematic errors are evaluated. We conclude that the average sizes determined in this manner possess the necessary degree of stability, showing a weak dependence on the applied scanning variable and the total number of experimental points.</p>","PeriodicalId":671,"journal":{"name":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","volume":"18 5","pages":"1022 - 1032"},"PeriodicalIF":0.5000,"publicationDate":"2024-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques","FirstCategoryId":"1085","ListUrlMain":"https://link.springer.com/article/10.1134/S1027451024700770","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"PHYSICS, CONDENSED MATTER","Score":null,"Total":0}
引用次数: 0
Abstract
To determine the size distribution of structurally ordered clusters dispersed within a structurally disordered alloy matrix, we analyze the diffraction patterns of the Fe74Al26 alloy obtained using a high-resolution neutron diffractometer. This analysis employs the generalized Scherrer method, which involves analyzing diffraction-peak profiles, determining peak widths at heights of 1/5 and 4/5 of the maximum, and assuming a gamma distribution for cluster sizes (Pielaszek method). We compare the results obtained using the Scherrer, Williamson–Hall, and Pielaszek methods, finding them to agree. We propose an algorithm to calculate the log-normal distribution function of cluster/particle sizes. Experimental data are obtained using a time-of-flight neutron diffractometer. The analysis is conducted for two scanning variable options: in the crystallographic (direct) (d scale) and reciprocal (H scale) spaces, and possible systematic errors are evaluated. We conclude that the average sizes determined in this manner possess the necessary degree of stability, showing a weak dependence on the applied scanning variable and the total number of experimental points.
期刊介绍:
Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.