Determination of the Ratio of Atoms and Molecules in a Tellurium Beam Using a Mass Spectrometer

V. I. Mikhailov, L. E. Polyak
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Abstract

The work is devoted to clarifying the ratio of atoms and molecules of tellurium vapor in interaction with various metal substrates (copper, nickel). Atoms (Te) and molecules (Te2) present in the tellurium vapor phase in mass spectrometric measurements correspond to ion currents of monomers J(Te+) and dimers J(\({\text{Te}}_{2}^{ + }\)). The work is performed on a molecular beam epitaxy unit with desorption flow control by mass spectrometry and surface condition by reflection high-energy electron diffraction (RHEED). A molecular tellurium beam is obtained using a Knudsen type source. It is shown that the proportion of monomers in the total desorption beam significantly depends on the temperature of the substrate. This dependence corresponds to the dissociation energy of Te2 molecules on the order of 1.18 eV. At high temperatures (900 K), the proportion of Te monomers can reach 85%; at low temperatures (650 K), 8%. This circumstance should be taken into account when the composition of the vapor phase from the beam source can affect the processes under study. In particular, in mass spectrometric studies of the interaction of the vapor phase with the surface of a solid, for example, in the process of molecular beam epitaxy of CdTe.

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使用质谱仪测定碲光束中的原子和分子比率
这项工作致力于澄清碲蒸气与各种金属底物(铜、镍)相互作用时原子和分子的比例。质谱测量中存在于碲气相中的原子(Te)和分子(Te2)对应于单体J(Te+)和二聚体J(\({\text{Te}}_{2}^{ + }\))的离子电流。这项工作是在分子束外延单元上进行的,用质谱法控制脱附流动,用反射高能电子衍射(RHEED)控制表面条件。利用Knudsen型源获得了分子碲束。结果表明,单体在总解吸束中的比例与基体温度有显著的关系。这种依赖关系对应于Te2分子的解离能约为1.18 eV。在高温(900 K)下,Te单体的比例可达85%%; at low temperatures (650 K), 8%. This circumstance should be taken into account when the composition of the vapor phase from the beam source can affect the processes under study. In particular, in mass spectrometric studies of the interaction of the vapor phase with the surface of a solid, for example, in the process of molecular beam epitaxy of CdTe.
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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