Synthesis of Gallium(II) Sulfide

D. N. Borisenko
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Abstract

The synthesis of gallium(II) sulfide was carried out from elements in a closed volume using a two-temperature method. Passivation of the gallium surface in vacuum was observed up to temperatures of 1623 К. The controlled chemical reaction was carried out in a hydrogen atmosphere at a pressure of 1300–2600 Pa. Similar results were achieved in vacuum using photocatalysis with ultraviolet radiation at a wavelength of 240–320 nm with a radiant power of 24.6 W. In both cases, at a temperature of 1323–1373 К gallium(II) sulfide synthesis took no more than 30 min with a loading mass of 100 g. The Rietveld method was used to characterize crystalline gallium(II) sulfide by powder X-ray diffraction. The results of analysis showed that the product of the chemical reaction was a single-phase GaS. The proposed solution to the problem of gallium melt surface passivation for sulfur oligomers from the point of view of quantum electrodynamics made it possible to significantly reduce energy costs and increase the synthesis efficiency of extrapure gallium(II) sulfide for its further use in chalcogenide glasses production.

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硫化镓(II)的合成
采用双温法在密闭体积中合成了硫化镓(II)。在真空中观察到镓表面的钝化直至温度为1623 К。受控化学反应是在压力为1300 - 2600pa的氢气气氛中进行的。在真空条件下,紫外辐射波长为240 ~ 320 nm,辐射功率为24.6 W,光催化也获得了类似的结果。在这两种情况下,在1323-1373 К温度下,镓(II)硫化物合成不超过30分钟,负载质量为100 g。采用Rietveld方法对硫化镓晶体进行了粉末x射线衍射表征。分析结果表明,化学反应产物为单相气体。从量子电动力学的角度解决硫低聚物的镓熔体表面钝化问题,可以显著降低能量成本,提高外浸硫化镓(II)的合成效率,从而进一步用于硫系玻璃的生产。
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来源期刊
CiteScore
0.90
自引率
25.00%
发文量
144
审稿时长
3-8 weeks
期刊介绍: Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques publishes original articles on the topical problems of solid-state physics, materials science, experimental techniques, condensed media, nanostructures, surfaces of thin films, and phase boundaries: geometric and energetical structures of surfaces, the methods of computer simulations; physical and chemical properties and their changes upon radiation and other treatments; the methods of studies of films and surface layers of crystals (XRD, XPS, synchrotron radiation, neutron and electron diffraction, electron microscopic, scanning tunneling microscopic, atomic force microscopic studies, and other methods that provide data on the surfaces and thin films). Articles related to the methods and technics of structure studies are the focus of the journal. The journal accepts manuscripts of regular articles and reviews in English or Russian language from authors of all countries. All manuscripts are peer-reviewed.
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