Polar coordinate-based background removal algorithm for 2D x-ray scattering data.

IF 1.7 4区 工程技术 Q3 INSTRUMENTS & INSTRUMENTATION Review of Scientific Instruments Pub Date : 2024-12-01 DOI:10.1063/5.0236066
Pu Guo, Xu Zheng, JiChao Jiang, ShuaiShuai Yin, Chenggong Zhang, Bin Yang, Yitao Cui, Tong Yang, Yueliang Gu, Xiaolong Li, Xingmin Zhang
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Abstract

During the data collection of x-ray diffraction experiments with various detectors, background signals are often unavoidable along with the sample signal. Addressing the background during post-data analysis is not a straightforward task. In this work, we introduced an algorithm specifically designed to handle centrally symmetric two-dimensional x-ray diffraction data and processed the data using the Python programming language. The two-dimensional data are first transformed from Cartesian coordinates to polar coordinates. Second, utilizing existing background processing algorithms, one-dimensional background curves are identified for each azimuth angle. These background data are then merged to generate two-dimensional background data. Finally, by subtracting the background from the original data, we obtain the clear diffraction signal. The algorithm can effectively remove the background from x-ray diffraction data and exhibits the ability to handle backgrounds with high intensity and irregular shapes, and the discernibility of the weak signal is significantly enhanced. Moreover, researchers have the flexibility to choose whether to preserve or eliminate the signals from additional amorphous components based on their needs. This algorithm will provide researchers with the possibility for further data analysis.

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基于极坐标的二维x射线散射数据背景去除算法。
在用各种探测器进行x射线衍射实验的数据采集过程中,背景信号往往与样品信号一起不可避免。在后期数据分析中处理背景并不是一项简单的任务。在这项工作中,我们介绍了一种专门设计用于处理中心对称二维x射线衍射数据的算法,并使用Python编程语言处理数据。首先将二维数据从笛卡尔坐标转换为极坐标。其次,利用现有的背景处理算法,对每个方位角进行一维背景曲线识别;然后将这些背景数据合并生成二维背景数据。最后,从原始数据中减去背景,得到清晰的衍射信号。该算法能有效地去除x射线衍射数据中的背景,对高强度和不规则形状的背景具有较强的处理能力,对弱信号的识别能力明显增强。此外,研究人员可以根据需要灵活选择是否保留或消除来自额外非晶元件的信号。该算法将为研究人员提供进一步数据分析的可能性。
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来源期刊
Review of Scientific Instruments
Review of Scientific Instruments 工程技术-物理:应用
CiteScore
3.00
自引率
12.50%
发文量
758
审稿时长
2.6 months
期刊介绍: Review of Scientific Instruments, is committed to the publication of advances in scientific instruments, apparatuses, and techniques. RSI seeks to meet the needs of engineers and scientists in physics, chemistry, and the life sciences.
期刊最新文献
The design and analysis of high-precision x-ray mirror benders for Kirkpatrick-Baez mirror system in Hefei advanced light facility. Study on dead zone light recovery of silicon photomultipliers (SiPM) based on focon/tapered fiber arrays. In situ study on the thermoelectric properties of monolayer MoS2 film. Development of an ultraprecise glue-free bimorph deformable mirror with a length of 460 mm. Design and operation of APEX-LD: A compact levitated dipole for a positron-electron experiment.
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