Synthesis and Characterization of Aluminum-doped ZnO Nanostructures via a Simple Solution Method for Effective Passivation of a Silicon Surface

IF 2.2 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Journal of Electronic Materials Pub Date : 2024-11-20 DOI:10.1007/s11664-024-11592-x
Premshila Kumari, Anjali Saini,  Diksha, Jai S. Tawale, P. Prathap, Sanjay Kumar Srivastava
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Abstract

Here, aluminum (Al)-doped zinc oxide (ZnO) nanostructures (AZO NSs) were synthesized via a chemical colloidal route with controlled structural, optical, photoluminescence (PL), and enhanced silicon (Si) surface passivation properties as a function of Al doping in the ZnO. Doping concentrations ranging from 2 at.% to 10 at.% Al were investigated. A dramatic change in the morphology of the AZO NSs was observed with varying Al doping concentrations. The undoped ZnO sample exhibited a particle-like morphology with a diameter of ~95 nm, which became flake-like structures and then hexagonal discs with an increase in the Al doping concentration. The band gap energy increased from 3.17 eV for undoped ZnO NSs to 3.28 eV corresponding to 2 at.% doped AZO NSs. In addition, defects consisting of zinc and oxygen vacancies/interstitials were minimized with Al doping, which was attributed to the replacement of Zn2+ ions by Al3+. Moreover, almost 15-fold enhancement in the passivation of the Si surface was exhibited by the optimized AZO NSs (4 at.%) as compared to the non-passivated Si surface and > 11-fold as compared to that of the undoped ZnO-coated Si surface. Effective surface passivation, thereby minimizing surface recombination, is one of the key requirements for efficient Si solar cells. Thus, the present study, reporting a simple synthesis route with improved structural, optical, PL, and surface passivation properties of AZO NSs as a function of Al doping, may pave the way for application in solar cells.

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来源期刊
Journal of Electronic Materials
Journal of Electronic Materials 工程技术-材料科学:综合
CiteScore
4.10
自引率
4.80%
发文量
693
审稿时长
3.8 months
期刊介绍: The Journal of Electronic Materials (JEM) reports monthly on the science and technology of electronic materials, while examining new applications for semiconductors, magnetic alloys, dielectrics, nanoscale materials, and photonic materials. The journal welcomes articles on methods for preparing and evaluating the chemical, physical, electronic, and optical properties of these materials. Specific areas of interest are materials for state-of-the-art transistors, nanotechnology, electronic packaging, detectors, emitters, metallization, superconductivity, and energy applications. Review papers on current topics enable individuals in the field of electronics to keep abreast of activities in areas peripheral to their own. JEM also selects papers from conferences such as the Electronic Materials Conference, the U.S. Workshop on the Physics and Chemistry of II-VI Materials, and the International Conference on Thermoelectrics. It benefits both specialists and non-specialists in the electronic materials field. A journal of The Minerals, Metals & Materials Society.
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