Tianhong Ouyang, Yi-Chen Chen, Koustav Kundu, Xingjian Zhong, Yixin Mei, Akilesh Nalluri, Allison M. Dennis, Björn M. Reinhard
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引用次数: 0
Abstract
The caption of Figure 4 in the text of our publication contains an error. Figure 4 does not contain a plot of all ΓET(ω) data as stated in the caption but of ΓET(ω) data for all AgNP@CuFeS2 preparations with an average ΓET > 0.3 eV. For completeness, we include below the ΓET(ω) plot for all AgNP@CuFeS2 preparations. The interpolation (black line) contains a maximum at ω = 2.469 eV, which is nearly identical to the value of 2.489 eV that was determined from the original figure with the narrower ΓET distribution and does not change the interpretation of the data. We apologize for any confusion this error may have created. All authors have approved this correction. Figure 4. ΓET (blue points) for all AgNP@CuFeS2 conditions plotted as a function of the resonance frequency ωres. A polynomial interpolation is included as a black line. The red line shows the simulated scattering spectrum of an individual CuFeS2 NC (nr = 1.5000). This article has not yet been cited by other publications.
期刊介绍:
ACS Nano, published monthly, serves as an international forum for comprehensive articles on nanoscience and nanotechnology research at the intersections of chemistry, biology, materials science, physics, and engineering. The journal fosters communication among scientists in these communities, facilitating collaboration, new research opportunities, and advancements through discoveries. ACS Nano covers synthesis, assembly, characterization, theory, and simulation of nanostructures, nanobiotechnology, nanofabrication, methods and tools for nanoscience and nanotechnology, and self- and directed-assembly. Alongside original research articles, it offers thorough reviews, perspectives on cutting-edge research, and discussions envisioning the future of nanoscience and nanotechnology.