{"title":"Cryogenic TOF-SIMS Around Sublimation Temperature of Quench-Condensed Noble Gas (Ne, Ar, and Kr) Films","authors":"Taku T. Suzuki","doi":"10.1002/jms.5107","DOIUrl":null,"url":null,"abstract":"<div>\n \n <p>A possible TOF-SIMS analysis of surface phase transitions has recently been proposed for limited cases such as polymers and ionic liquids. In the present study, we have extended this analysis to quench-condensed noble gas films. The newly developed cryogenic TOF-SIMS allowed both measurements of TOF-SIMS below 4 K, and low-energy ion scattering spectroscopy that is used to prepare a clean surface. It was found that the TOF-SIMS intensity variation by increasing the temperature at a constant ramp rate (temperature-programmed TOF-SIMS) shows steep changes due to sublimation. Thus, the possibility of analyzing the surface phase transition at the local region defined by the incident ion beam of (cryogenic) TOF-SIMS was demonstrated in the present study.</p>\n </div>","PeriodicalId":16178,"journal":{"name":"Journal of Mass Spectrometry","volume":"60 1","pages":""},"PeriodicalIF":2.0000,"publicationDate":"2024-12-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Mass Spectrometry","FirstCategoryId":"92","ListUrlMain":"https://analyticalsciencejournals.onlinelibrary.wiley.com/doi/10.1002/jms.5107","RegionNum":3,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"BIOCHEMICAL RESEARCH METHODS","Score":null,"Total":0}
引用次数: 0
Abstract
A possible TOF-SIMS analysis of surface phase transitions has recently been proposed for limited cases such as polymers and ionic liquids. In the present study, we have extended this analysis to quench-condensed noble gas films. The newly developed cryogenic TOF-SIMS allowed both measurements of TOF-SIMS below 4 K, and low-energy ion scattering spectroscopy that is used to prepare a clean surface. It was found that the TOF-SIMS intensity variation by increasing the temperature at a constant ramp rate (temperature-programmed TOF-SIMS) shows steep changes due to sublimation. Thus, the possibility of analyzing the surface phase transition at the local region defined by the incident ion beam of (cryogenic) TOF-SIMS was demonstrated in the present study.
期刊介绍：
The Journal of Mass Spectrometry publishes papers on a broad range of topics of interest to scientists working in both fundamental and applied areas involving the study of gaseous ions.
The aim of JMS is to serve the scientific community with information provided and arranged to help senior investigators to better stay abreast of new discoveries and studies in their own field, to make them aware of events and developments in associated fields, and to provide students and newcomers the basic tools with which to learn fundamental and applied aspects of mass spectrometry.
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