Marisel Di Pietro Martínez, Alexis Wartelle, Nicolas Mille, Stefan Stanescu, Rachid Belkhou, Farid Fettar, Vincent Favre-Nicolin, Guillaume Beutier
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引用次数: 0
Abstract
Polarized x-rays allow for imaging birefringent or dichroic properties of materials with nanometric resolution. To disentangle these properties from the electronic density, either a polarization analyzer or several measurements with different polarizations (typically two or more) are needed. Here we demonstrate that ptychography can disentangle these from a single polarization measurement by using a multimodal analysis. This new method provides an alternative to obtain polarization-resolved images of a sample when manipulating the incident polarization is not possible or sufficient. Published by the American Physical Society2025
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Physical review letters(PRL)covers the full range of applied, fundamental, and interdisciplinary physics research topics:
General physics, including statistical and quantum mechanics and quantum information
Gravitation, astrophysics, and cosmology
Elementary particles and fields
Nuclear physics
Atomic, molecular, and optical physics
Nonlinear dynamics, fluid dynamics, and classical optics
Plasma and beam physics
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