Eslam Abubakr;Ashenafi Abadi;Masaaki Oshita;Shiro Saito;Hironori Suzuki;Tetsuo Kan
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引用次数: 0
Abstract
While Au is commonly utilized in semiconductor fabrication, its interaction with Si yields unstable contacts, posing potential reliability concerns. In this work, Cr interlayers were integrated to improve interface properties, enhance charge carrier transport within a plasmonic photodetector, and ensure long-term stability, demonstrated by consistent responses under zero bias and room-temperature conditions over the span of a year. The induced Fermi level shifts and Schottky barrier lowering to 0.59 eV, improving responsivity and extending the operation range beyond 1850 nm with increased sensitivity, allowing for precise reconstructive spectroscopy (RS). This is promising for reliable compound identification based on specific bond absorbance properties while scaling down IR spectroscopy to chip level, promoting applications like environmental monitoring and gas detection.
期刊介绍:
IEEE Transactions on Electron Devices publishes original and significant contributions relating to the theory, modeling, design, performance and reliability of electron and ion integrated circuit devices and interconnects, involving insulators, metals, organic materials, micro-plasmas, semiconductors, quantum-effect structures, vacuum devices, and emerging materials with applications in bioelectronics, biomedical electronics, computation, communications, displays, microelectromechanics, imaging, micro-actuators, nanoelectronics, optoelectronics, photovoltaics, power ICs and micro-sensors. Tutorial and review papers on these subjects are also published and occasional special issues appear to present a collection of papers which treat particular areas in more depth and breadth.