Measurement and Analysis of Surface Temperature Gradients on Magnetron Sputtered Thin Film Growth Studied Using NiCr/NiSi Thin Film Thermocouples (Small 1/2025)
Zhihui Liu, Yumeng Yang, Yi Sun, Tengda Guo, Kai Shen, Yongjun Cheng, Bi Wang, Kai Hu, Chuanbing Zhang, Gang Hao, Jiankang Zhou, Mengxuan Wu, Baoli Cui, Wanyu Ding, Zixi Wang
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引用次数: 0
Abstract
Thin Film Growth
In article number 2404829, Wanyu Ding, Zixi Wang, and co-workers established a three-layer NiCr/NiSi thin-film thermocouple temperature measurement system in TiO2 film growth processes, to measure the temperature gradient from TiO2 film growth surface to substrate. The temperature of substrate was about 132.05 °C, while the temperature difference between TiO2 film growth surface and substrate could reach to was about 144.71 °C.
期刊介绍:
Small serves as an exceptional platform for both experimental and theoretical studies in fundamental and applied interdisciplinary research at the nano- and microscale. The journal offers a compelling mix of peer-reviewed Research Articles, Reviews, Perspectives, and Comments.
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