Measurement and Analysis of Surface Temperature Gradients on Magnetron Sputtered Thin Film Growth Studied Using NiCr/NiSi Thin Film Thermocouples (Small 1/2025)

IF 12.1 2区 材料科学 Q1 CHEMISTRY, MULTIDISCIPLINARY Small Pub Date : 2025-01-08 DOI:10.1002/smll.202570004
Zhihui Liu, Yumeng Yang, Yi Sun, Tengda Guo, Kai Shen, Yongjun Cheng, Bi Wang, Kai Hu, Chuanbing Zhang, Gang Hao, Jiankang Zhou, Mengxuan Wu, Baoli Cui, Wanyu Ding, Zixi Wang
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Abstract

Thin Film Growth

In article number 2404829, Wanyu Ding, Zixi Wang, and co-workers established a three-layer NiCr/NiSi thin-film thermocouple temperature measurement system in TiO2 film growth processes, to measure the temperature gradient from TiO2 film growth surface to substrate. The temperature of substrate was about 132.05 °C, while the temperature difference between TiO2 film growth surface and substrate could reach to was about 144.71 °C.

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NiCr/NiSi薄膜热电偶(Small 1/2025)磁控溅射薄膜生长表面温度梯度的测量与分析
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来源期刊
Small
Small 工程技术-材料科学:综合
CiteScore
17.70
自引率
3.80%
发文量
1830
审稿时长
2.1 months
期刊介绍: Small serves as an exceptional platform for both experimental and theoretical studies in fundamental and applied interdisciplinary research at the nano- and microscale. The journal offers a compelling mix of peer-reviewed Research Articles, Reviews, Perspectives, and Comments. With a remarkable 2022 Journal Impact Factor of 13.3 (Journal Citation Reports from Clarivate Analytics, 2023), Small remains among the top multidisciplinary journals, covering a wide range of topics at the interface of materials science, chemistry, physics, engineering, medicine, and biology. Small's readership includes biochemists, biologists, biomedical scientists, chemists, engineers, information technologists, materials scientists, physicists, and theoreticians alike.
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